Ut-battelle, Inc.

Regina Kay Ferrell

Philip R Bingham

Justin S Baba

Kenneth William Tobin, Jr

Thomas P Karnowski

David S Bolme

Hector J Santos-Villalobos

Christi R Johnson

Matthew R Eicholtz

Sreenivas R Sukumar

Mallikarjun Shankar

Methods and apparatus are disclosed for producing high quality images in uncontrolled or impaired environments. In some examples of the disclosed technology, groups of cameras for high dynamic range (HDR), polarization diversity, and optional other diversity modes are arranged to concurrently image a common scene. For example, in a vehicle checkpoint application, HDR provides discernment of dark objects inside a vehicle, while polarization diversity aids in rejecting glare. Spectral diversity, infrared imaging, and active illumination can be applied for better imaging through a windshield. Preprocessed single-camera images are registered and fused. Faces or other features of interest can be detected in the fused image and identified in a library. Impairments can include weather, insufficient or interfering lighting, shadows, reflections, window glass, occlusions, or moving objects.

Optical array for high-quality imaging in harsh environments

A computer implemented method integrates data from remote disparate data sources by processing a non-transitory media. The non-transitory media stores instructions for detecting data sets in different formats hosted in a plurality of heterogeneous databases that are accessible through a distributed network. The method extracts schema data from the plurality of heterogeneous databases and identifies related fields in two or more of the heterogeneous databases. The method links the related fields in the two or more of the plurality of heterogeneous databases and makes the data accessible through a virtual warehouse. As schemas change, as new data sources and analysis artifacts are created, the computer implemented method and system can act as a meta-data store, a provenance tracking device, and/or a knowledge management service.

Knowledge catalysts

A method for indexing and retrieving manufacturing-specific digital images based on image content comprises three steps. First, at least one feature vector can be extracted from a manufacturing-specific digital image stored in an image database. In particular, each extracted feature vector corresponds to a particular characteristic of the manufacturing-specific digital image, for instance, a digital image modality and overall characteristic, a substrate/background characteristic, and an anomaly/defect characteristic. Notably, the extracting step includes generating a defect mask using a detection process. Second, using an unsupervised clustering method, each extracted feature vector can be indexed in a hierarchical search tree. Third, a manufacturing-specific digital image associated with a feature vector stored in the hierarchicial search tree can be retrieved, wherein the manufacturing-specific digital image has image content comparably related to the image content of the query image. More particularly, can include two data reductions, the first performed based upon a query vector extracted from a query image. Subsequently, a user can select relevant images resulting from the first data reduction. From the selection, a prototype vector can be calculated, from which a second-level data reduction can be performed. The second-level data reduction can result in a subset of feature vectors comparable to the prototype vector, and further comparable to the query vector. An additional fourth step can include managing the hierarchical search tree by substituting a vector average for several redundant feature vectors encapsulated by nodes in the hierarchical search tree.

Method for indexing and retrieving manufacturing-specific digital imagery based on image content

A method for localizing and isolating an errant process includes the steps of retrieving from a defect image database a selection of images each image having image content similar to image content extracted from a query image depicting a defect, each image in the selection having corresponding defect characterization data. A conditional probability distribution of the defect having occurred in a particular process step is derived from the defect characterization data. A process step as a highest probable source of the defect according to the derived conditional probability distribution is then identified. A method for process step defect identification includes the steps of characterizing anomalies in a product, the anomalies detected by an imaging system. A query image of a product defect is then acquired. A particular characterized anomaly is then correlated with the query image. An errant process step is then associated with the correlated image.

Method for localizing and isolating an errant process step

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Knoxville, TN, United States of America

Regina Kay Ferrell