Other

Compass Technology Group, LLC

Rebecca Schultz

John Weber Schultz

James Geoffrey Maloney

Kathleen Maloney

Various examples of methods and systems are disclosed for correction of phase and amplitude errors that occur in transmission lines connecting transmitter/receiver devices to measurement fixtures. In one example, a method is described that includes using time domain processing to determine a phase shift from the measurement fixture that can occur between calibration measurements and measurements of the specimen under test. In another example, a method is described that includes frequency-domain processing of the signals to obtain both phase and amplitude corrections. Including these phase and amplitude corrections in the calibration procedure can reduce or minimize the errors induced in the measurements when the transmission line(s) experience either temperature changes or physical deflections, among other things.

Correction of transmission line induced phase and amplitude errors in reflectivity measurements

Various examples of methods and systems are disclosed for non-contact determination of coating thickness. In one example, among others, a method includes illuminating a surface having a layer of a coating material with electromagnetic (EM) energy transmitted at two or more frequencies, obtaining measured reflection data from reflected EM energy, and matching the measured reflection data to modeled reflection data of a reflection model based upon minimization of an error between the measured reflection data and the modeled reflection data to determine a measured thickness of the layer. In another example, a system includes a probe configured to illuminate an area of the surface including a layer of a coating material with EM energy and receive reflected EM energy, and a processing device configured to determine a measured thickness of the layer based upon minimization of an error between measured reflection data and modeled reflection data.

Non-contact determination of coating thickness

An electromagnetic chamber absorber provided improved absorption across a wideband and both lower diffuse and specular scatter and a method for constructing the same. An exemplary device can compromise a periodic arrangement of disconnected electromagnetically lossy elements where the periodicity of the lattice is adjusted to suppress all or most grating lobe scattering. Because the electromagnetically lossy elements are disconnected, scalable manufacturing approaches are enabled. The lossy elements can be easily fabricated via shaping, which includes rolling, folding and cutting resistive and/or magnetic sheet materials. The lossy elements can be repeatably placed in a periodic lattice using low density scaffolding approaches and/or other alignment mechanisms. The absorption at the lower frequency part of the electromagnetic bands (below 1-2 GHz) can be improved via the addition of parallel lossy sheets into the low-density scaffolding.

Low diffuse scatter, anechoic chamber absorber

Various examples of methods and systems are provided for traveling wave spot probes. In one embodiment, among others, a traveling wave spot probe includes one or more antennas positioned proximate to a coated surface. The one or more antennas can be configured to excite a surface traveling wave moving over an area under test by launching radio frequency (RF) energy at approximately a grazing angle to the coated surface under test. The one or more antennas can be positioned on a base placed proximate to the coated surface. The base can define the area of the coated surface under test. In another embodiment, a method for non-destructive testing of a coated surface includes positioning one or more antennas proximate to a coated surface and exciting a surface traveling wave over an area under test by transmitting RF energy via at least a portion of the one or more antennas.

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Alpharetta, GA, United States of America

Rebecca Schultz