Fei Comapny

University of California

University of Illinois

Raymond Wagner

Hendrik Nicolaas Slingerland

Peter Christiaan Tiemeijer

Frank Jeroen Pieter Schuurmans

Jan Willem Bruggers

Alan Frank De Jong

Ivan Petrov

Andreas Karl Schmid

Gerbert Jeroen Van De Water

Todor I Donchev

Thomas Duden

Eric Olson

Jeroen Van De Water

Johannes Van Den Oetelaar

Adriaan Huibert Dirk Ottevanger

Frank Schuurmans

Karel Diederick Van Der Mast

The invention relates to a hybrid phase plate for use in a TEM. The phase plate according to the invention resembles a Boersch phase plate in which a Zernike phase plate is mounted. As a result the phase plate according to the invention resembles a Boersch phase plate for electrons scattered to such an extent that they pass outside the central structure () and resembles a Zernike phase plate for scattered electrons passing through the bore of the central structure. Comparing the phase plate of the invention with a Zernike phase plate is has the advantage that for electrons that are scattered over a large angle, no electrons are absorbed or scattered by a foil, resulting in a better high resolution performance of the TEM. Comparing the phase plate of the invention with a Boersch phase plate the demands for miniaturization of the central structure are less severe.

Hybrid phase plate

A manipulator for use in e.g. a Transmission Electron Microscope (TEM) is described, said manipulator capable of rotating and translating a sample holder (). The manipulator clasps the round sample holder between two members (A,B), said members mounted on actuators (A,B). Moving the actuators in the same direction results in a translation of the sample holder, while moving the actuators in opposite directions results in a rotation of the sample holder.

Manipulator for rotating and translating a sample holder

Sample carriers for use in Transmission Electron Microscopes (TEMs) and freely commercially available have the form of a gauze with a strengthening edge. The thickness of these known sample carriers is of the order of magnitude of 20 &#x3bc;m, and is uniform across the entire sample holder. The tiny thickness of these fragile sample carriers makes manipulation difficult. There is a desire to realize automatic introduction and removal of sample carriers in a TEM, seeing as this would make it possible to use the TEM continuously, without human intervention. The invention describes a robust sample carrier whereby&#x2014;both in the case of manual and automatic manipulation&#x2014;deformation of and/or damage to the sample carrier is avoided. This is achieved by employing a strengthening edge portion 2 with a thickness 6 larger than the thickness 5 of the middle portion 1 of the sample carrier. The ability to use the sample carrier in analyses in which tilting is important is hereby not impeded.

Sample carrier for carrying a sample to be irradiated with an electron beam

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Gorinchem, Netherlands

Raymond Wagner