Mcube, Inc.

Media Lario S.r.l.

Raymond Merrill, Jr

Hong Wan

Daniel G Stearns

Anthony Francis Flannery, Jr

Natale Ceglio

Shingo Yoneoka

Dave Paul Jensen

Yuan-Chun Liu

David Paul Jensen

A system for testing a device under a high gravitational force including a centrifuge with a rotating member and method of operation thereof. An operating power can be applied to a device, which can be coupled to the rotating member. The system can include a rotational control that can be coupled to the centrifuge. This rotational control can be configured to rotate the rotating member in response to a controlled number of revolutions per time period. The system can also include an analysis device for monitoring one or more signals from the device with respect to the controlled number of revolutions per time period. The analysis device can be configured to determine a stiction force associated with the DUT (Device Under Test) in response to the time-varying gravitational forces and to the one or more signals from the DUTs.

Centrifuge MEMS stiction test system and method

A centrifuge screening system and method of testing MEMS devices using the system. The wafer level centrifuge screening system can include a base centrifuge system and a cassette mounting hub coupled to the base centrifuge system. The method can include applying a smooth and continuous acceleration profile to one or more MEMS components via the base centrifuge system. Each of the one or more MEMS components can have one or more MEMS devices formed thereon. The one or more MEMS components can be provided in one or more cassettes configured on the cassette mounting hub. The method can also include identifying one or more target MEMS components, which can include identifying stiction in one or more MEMS devices on the one or more MEMS components.

Centrifuge MEMS stiction detection and screening system and method

A wafer level centrifuge (WLC) system and method of testing MEMS devices using the system. The wafer level centrifuge (WLC) system can include a base centrifuge system and a cassette mounting hub coupled to the base centrifuge system. The method can include applying a smooth and continuous acceleration profile to two or more MEMS wafers via the base centrifuge system. Each of the two or more MEMS wafers can have one or more MEMS devices formed thereon. The two or more MEMS wafers can be provided in two or more wafer holding cassettes configured on the cassette mounting hub. The method can also include identifying one or more target MEMS wafers, which can include identifying stiction in one or more MEMS devices on the one or more MEMS wafers.

Wafer level centrifuge for MEMS stiction detection and screening system and method

Systems and methods for synchronous operation of debris-mitigation devices (DMDs) in an EUV radiation source that emits EUV radiation and debris particles are disclosed. The methods include establishing a select relative angular orientation between the first and second DMDs that provides a maximum amount of transmission of EUV radiation between respective first and second rotatable vanes of the first and second DMDs. The methods also include rotating the first and second sets of vanes to capture at least some of the debris particles while substantially maintaining the select relative angular orientation. The systems employ DMD drive units, and an optical-based encoder disc in one of the DMD drive units measures and controls the rotational speed of the rotatable DMD vanes. Systems and methods for optimally aligning the DMDs are also disclosed.

Systems and methods for synchronous operation of debris-mitigation devices

A method for providing acceleration data with reduced substrate-displacement bias includes receiving in an accelerometer an external acceleration, determining the acceleration data with reduced substrate displacement bias in a compensation portion in response to a first and a second displacement indicators from a MEMS transducer, and, in response to substrate compensation factors from a MEMS compensation portion, outputting the acceleration data with reduced substrate displacement bias, wherein the first displacement indicator and the second displacement indicator are determined by the MEMS transducer relative to a substrate in response to the external acceleration and to a substrate displacement, and wherein the substrate compensation factors are determined by the MEMS compensation portion relative to the substrate in response to the substrate displacement.

Substrate curvature compensation methods and apparatus

A computer implemented method for initiating capture of an image on a computer system, performed by the computer system that is programmed to perform the method includes determining by a physical sensor of the computer system, a change in physical state of the computer system, wherein the change in physical state is associated with a magnitude of change in physical state, determining by the computer system, whether the magnitude of change in physical state by the physical sensor exceeds a threshold level, determining by the computer system, a plurality of parameters for a camera associated with the computer system, and initiating by the computer system, capture of one or more images using the camera after the magnitude of change in physical state by the physical sensor exceeds the threshold level.

Methods and apparatus for initiating image capture on a hand-held device

A handheld device for capturing magnetic credit card data includes a MEMS magnetic field sensor disposed within the housing, wherein the MEMS magnetic field sensor is configured to determine a plurality of magnetic data stored on a magnetic stripe of a user provided media when the user disposes a user provided media proximate to the housing, and a processor disposed within the housing and coupled to the MEMS magnetic field sensor, wherein the processor is programmed to receive the plurality of user data stored on the user provided media, wherein the processor is configured to execute an application program, and wherein the processor is programmed to provide at least a subset of the plurality of user data to the application program.

Methods and apparatus for capturing magnetic credit card data on a hand held device

A computer implemented method for processing data stored on a magnetic stripe of a user medium performed by a hand-held computer system includes displaying an alignment GUI on a display of the computer system, wherein the GUI includes a visual alignment mark on the display at a first offset relative to a MEMS magnetic field sensor in the computer system, wherein when a user aligns the user medium to the alignment mark GUI, a portion of a first track of the magnetic stripe is disposed above the MEMS magnetic field sensor, sensing, by the MEMS magnetic field sensor, magnetic data stored on the first track when the user aligns the user medium to the visual alignment mark, and moves the user medium along the visual alignment mark, and determining user data stored on the first track from the magnetic data stored on the first track.

Growing community of inventors

San Ramon, CA, United States of America

Raymond Merrill, Jr