Renishaw Plc

Renishaw Transducer Systems Limited

Raymond J Chaney

David R McMurtry

David N Batchelder

Mark A Chapman

Seamus McFadden

Stephen Mark Angood

David Wilson

Alan James Holloway

Brian J Smith

Christopher Kemp

Chunwei Cheng

Mark Adrian Vincent Chapman

Tingdi Liao

Mark A V Chapman

Jeffrey Graham

Jan Linnenbuerger

Anas F Jarjour

Damon Mark Northeast

Nigel J Copner

Sergey Loukianov

Jungang Huang

Richard J Lacey

A frequency tuneable laser device includes a cavity mode selector and a cavity tuning arrangement. The cavity mode selector has a frequency response with a selection feature that is alignable in frequency with a selected cavity mode of the laser device. The cavity tuning arrangement includes a plurality of reflective elements arranged in optical series, and is used to adjust the effective optical path length of the laser cavity to move the cavity modes in frequency. The laser device further includes making the cavity mode selector and the cavity tuning arrangement perform a simultaneous coordinated movement such that respective frequencies of the selection feature and the selected cavity mode vary with substantially the same dependence on a parameter characterizing the simultaneous coordinated movement. For example, a periscope with a co-rotating etalon can be used to provide mode hop free tuning of the laser device.

Laser device

A rotation detection kit, comprising: a beam source; a receiver comprising at least one beam intensity sensor; a polarizer device for location in the path of a beam emitted from the beam source and received by the beam sensor; and a modulator. The modulator is configured to modulate at least one of i) the beam source and ii) a beam emitted by the beam source to create a discretely varying polarization orientation thereby defining first and at least second temporally spaced beam portions. The temporally spaced beam portions are incident on the polarizer device and the beam sensor and have substantially identical profiles and at least an initial common propagation axis toward the polarizer device.

Rotation detection kit

In order to determine movements of two subjects, two or more signals of different phase are obtained which depend on the movement, and processed by locating constellation status of the signals in at least one co-ordinate axis system, it must have at least six separate segments rotationally displaced. Where there are two or more co-ordinate axis systems, each must have an axis radiating from an origin. The change in the constellation states is monitored using at least two processed data samples obtained by sampling the signals at a suitable clock rate. It is possible to derive a prediction of values of the signal and filter the signals in dependence on the prediction. The second co-ordinate axis system may be rotatable relative to the first co-ordinate axis system enabling the provision of a movable region of uncertainty.

Motion detection and analysis

Apparatus for producing and guiding a light beam, in particular for a laser interferometer, includes a laser having a laser tube ( ) and an external cavity ( ). Two laser beams ( A&prime; and B&prime;) of orthogonal polarization states are directed from the cavity into polarization maintaining fibers ( ). The two beams are generated from a single beam ( ) by a birefringent prism ( ) in the cavity. Additional beam steering prisms ( A and B) are included to direct the beams from the birefringent prism to the fibers. The additional steering prisms compensate for temperature induced beam deviations in the birefringent prisms. Interferometric sensing heads ( ) receive the beams from the fibers and include a rotatable wedge prism and mechanical adjustment means for guiding the beams onto reflecting surfaces on an object for positioning the object. The ends of the fibers attached to the sensing heads are kinematically located in the head.

Apparatus for producing and guiding a light beam

The output frequency of a semiconductor laser beam is stabilized using a grating or another optical device which has an interaction with the beam whose parameters are sensitive to the beam frequency. The grating ( ) generates positive and negative first order diffracted beams ( ), whose angle of diffraction is sensitive to the beam frequency, and is detected by split photodetectors AB, CD respectively. In the event of a change in beam frequency the outputs from the photodetectors AB, CD will vary to provide an error signal for the laser frequency. This error signal is insensitive to variations in angular alignment between the beam and the diffraction grating. This is because variations in frequency and variations in angular alignment cause different changes in the outputs of the photodetectors AB, CD.

Frequency stabilized semiconductor laser

A laser interferometer measuring system generates a series of digital output quadrature pulses corresponding to movement of a retroreflector 18. The output pulses are intended for receipt by a master counter containing an incremental count corresponding to displacement of the retroreflector 18. Errors present in the output pulses due to environmental or geometrical error sources in the interferometer may be compensated for by scaling the output pulses in accordance with a correction factor K. The output pulses are stored in a first counter 30, 130; a series of secondary pulses, being either the output pulses as scaled, or independently generated by a signal generator 200, are sent both to the master counter and a second counter 80, 180. A processor 50, 150 continually monitors the value of the second counter, and compares this with an actual value of displacement, equal to the product of the correction factor and the instantaneous value of the first counter. The frequency of secondary pulses transmitted to the master counter and the second counter is continually controlled by the processor in order to equalize the value of the second counter with the actual displacement value.

Real-time compensation system and method

Detector for explosive substances

A sample placed under a microscope is illuminated by light from a laser beam. Raman scattered light is passed back via a dichroic filter to various optical components which analyse the Raman spectrum, and thence to a CCD detector. The optical components for analysing the Raman spectrum include tunable dielectric filters in a filter wheel; a Fabry-Perot etalon; and a diffraction grating. These various components may be swapped into the optical path as desired, for example using movable mirrors, enabling the apparatus to be used very flexibly for a variety of different analysis procedures. Various novel analysis methods are also described.

Spectroscopic apparatus and methods

A laser interferometer, used for measuring displacement over long distances (e.g. 100 meters) includes an integral laser/detector unit 10, which emits a beam 12 of laser light. The fraction of the beam 12B which passes undiverted through a beam splitter 14 is laterally displaced by a periscope 18, which is positioned close to the laser 10. After passage through the periscope 18, the undiverted beam is incident upon a large retroreflector 20, whose size is such that the beam reflected by retroreflector 20 is laterally displaced by an amount greater than the lateral displacement due to passage of the beam through the periscope 18. Opaque housing 26 of the periscope 18 is used to screen reflected light from entrance into the laser cavity.

Laser interferometer for measuring object displacement over large

An absolute interferometer has part of the beam paths making up its measuring and reference arms formed in a waveguide, and part formed in air. The part formed in the waveguide are common mode so that the path length difference is formed in air, thus minimizing inaccuracies in the measurements caused by temperature changes in the waveguide. Phase modulators in the waveguide enable interpolation of the fringe counts to be made to high resolution. The absolute interferometer may be combined with a tracking interferometer, and with air refractometers, all of which have parts of their measuring and reference arms in the waveguide in common mode and symmetrical with each other.

Interferometric measuring apparatus for making absolute measurements of

Apparatus for calibration of an angular displacement

A straightness interferometer system for determining the straightness of the relative movement of two machine parts is disclosed in which the required optical elements are combined into two optical components. In particular one optical component consists of a cold light source, a straightness reflector and a detector all combined together, and linked to a remote laser by a fibre optical cable. The other optical component is a beam diverging prism, e.g. a Wollaston prism together with a retroreflector. The advantage, particularly in a moving bed machine, is that the Wollaston prism can be mounted on the fixed spindle, and the light source, straightness reflector and detector are all mounted on the machine bed without the risk of errors occurring due to tilting movements of the bed as it moves.

Two component straightness interferometer apparatus for measuring

A gas refractometer is disclosed for use with a measurement interferometer and which in its simplest form (FIG. 1 ) comprises an auxiliary interferometer which uses the same light source as the measurement interferometer and which provides two light paths therethrough of different lengths. The gas refractometer operates as a tracking interferometer by providing a signal indicative of changes in the refractive index of the atmosphere in which the measurement interferometer is operating. At the same time the gas refractometer is made to act as an absolute refractometer by arranging that the maximum change in the difference between the two path lengths within the refractometer which will be produced for the full range of refractive index variation under which measurements are likely to be made will be less than one wavelength of the light used. Various embodiments of the refractometer are described including variants in which two auxiliary interferometers are used, and the use of the refractometer output to correct the measurement interferometer reading or to control the wavelength of the light used is also described.

Absolute gas refractometer wherein the optical path difference of said

A laser interferometer uses an acousto-optically modulated laser (100) to produce a pair of orthogonally polarized frequency-shifted beams. The beams are passed down a monomode, polarization preserving optical fiber (110) in order to transmit the beams to a cavity (148). The beams are separated at polarizing beam splitter (128) and directed down measuring arm (130) and reference arm (132) of an interferometer. The beat frequency between the reflected beams is detected at photo-detector (146) which outputs a measuring signal (152). This beat frequency is compared to the beat frequency of the beams before entering the interferometer, which is derived by providing a semisilvered mirror (114) and interfering polaroid (116) in the path of the beams up-beam of the interferometer to produce a reference signal (126). The measuring and reference signals are compared to determine the movement of the measuring arm of the interferometer. This method of determining the reference signal makes the apparatus less susceptible to temperature changes.

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Berkeley, United Kingdom

Raymond J Chaney