Litepoint Corporation

Ray Wang

Christian Volf Olgaard

Chen Cao

Peter Petersen

System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.

System and method for measuring path loss of a conductive radio frequency (RF) test signal path

System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.

System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive signal testing

A digital communications test system and method for testing a plurality of devices under test (DUTs) in which multiple sets of a single vector signal analyzer (VSA) and single vector signal generator (VSG) can be used together to perform error vector magnitude (EVM) measurements for one or more DUTs in parallel, including one or more of composite, switched and multiple input multiple output (MIMO) EVM measurements. This allows N pairs of a VSA and VSG to test N DUTs with N&#xd7;N MIMO in substantially the sane time as a single VSA and VSG pair can test a single DUT, thereby allowing a substantial increase in testing throughput as compared to that possible with only a single VSA and VSG set.

Digital communications test system for multiple input, multiple output (MIMO) systems

A system and method for testing a data packet signal transceiver in which multiple network addresses (e.g., media access control, or MAC, addresses) are used to establish synchronization of the device under test and the test equipment controlling the test. In accordance with an exemplary embodiment, synchronization is established using a first MAC address, following which testing is conducted using a second MAC address.

System and method for using multiple network addresses to establish synchronization of a device under test and test equipment controlling the test

A digital communications test system and method for testing a plurality of devices under test (DUTs) in which multiple sets of a single vector signal analyzer (VSA) and single vector signal generator (VSG) can be used together to perform error vector magnitude (EVM) measurements for one or more DUTs in parallel, including one or more of composite, switched and multiple input multiple output (MIMO) EVM measurements. This allows N pairs of a VSA and VSG to test N DUTs with NxN MIMO in substantially the sane time as a single VSA and VSG pair can test a single DUT, thereby allowing a substantial increase in testing throughput as compared to that possible with only a single VSA and VSG set.

A method for testing a data packet transceiver as a device under test (DUT) by communicating, between one or more test instruments and the DUT, multiple data packets having at least one mutually distinct signal characteristic, such as data packet type, transmission power or transmission frequency.

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San Ramon, CA, United States of America

Ray Wang