Ignis Innovation Inc.

Photon Dynamics, Inc.

Ray Leerentveld

Jafar Talebzadeh

Reza Safaee-Rad

Jeffrey A Hawthorne

Aleksander Crnatovic

Branko Bukal

William K Pratt

Sunil S Sawkar

A system and method for determining the current of a pixel circuit and an organic light emitting diode (OLED). The pixel circuit is connected to a source driver by a data line. The voltage (or current) supplied to the pixel circuit by the source driver. The current of the pixel and the OLED can be measured by a readout circuit. A value of a voltage from the measured current can be extracted and provided to a processor for further processing.

Pixel measurement through data line

A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R&#xd7;S sensors; determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R&#xd7;S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with R&#xd7;S sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for R&#xd7;S sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.

Method and apparatus for optical inspection of a display

A method for inspecting a display panel includes capturing images of a portion of a plurality of display panels having display elements with an image acquisition device having sensor elements, each image comprising an image of approximately a first number of display elements captured with approximately a second number of sensor elements, the first number different from the second number, each image including a Moir&#xe9; artifact pattern, combining the images of the portion of the plurality of display panels to form a reference image including a Moir&#xe9; artifact pattern reference, capturing a sample image of a portion of a sample display panel having display elements with the image acquisition device, the sample image comprising an image of approximately the first number of display elements on the sample display captured with approximately the second number of sensor elements, the sample image including a sample Moir&#xe9; artifact pattern, combining the sample image with the reference image to inhibit the sample Moir&#xe9; artifact pattern from the sample image, and to form a test image, determining defects in display elements in the portion of the sample display panel by inspecting the test image, and determining whether to reject the sample display panel in response to the defects in the display elements.

Moir&#xe9; suppression method and apparatus

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Palgrave, Canada

Ray Leerentveld