National Semiconductor Corporation

Aptina Imaging Corporation

Micron Technology Incorporated

Other

Agilent Technologies, Inc.

Semiconductor Components Industries, LLC

Avago Technologies General IP (singapore) Pte. Ltd.

Avago Technologies General IP Pte, Ltd.

Ray Alan Mentzer

Julio R Estrada

Yan Ping Lim

Jeffery S Beck

Brian James Misek

Matthew Michael Borg

Cornelis Daniel Hoekstra

Duane G Quiet

Raymond Allen Davis

Jon L Fluker

Jeffery Steven Beck

Frank James Demonte

Jeffrey S Beck

An image sensor with an array of pixels is provided. In order to determine failure of transient signal generation circuitry within the image sensor, monitoring circuitry may be used to capture and adjust transient signals as the signals are being transmitted. The transient signals may be voltage booster signals that are generated by booster circuitry to adjust row control signal levels to be below the ground reference voltage or above the supply reference voltage before providing them to the array of image sensor pixels. The captured and adjusted transient signals may be multiplexed and transmitted through a common buffer circuit. The method of shifting/adjusting the captured voltages may also apply to static signals. The multiplexed adjusted signals may be converted from digital signals to analog signals with digital-to-analog conversion circuitry. The digitized signals may be transmitted to host circuitry for processing which may include pass/fail testing.

Imaging systems and methods for transient signal integrity verification

The present invention relates to a backside illuminated (BSI) imager having a plurality of layers. A plurality of pixel sensors are positioned on a first layer of a substrate. Pixel select conductors are positioned on the substrate in front of the first layer. Pixel readout conductors including a plurality of output lines, pixel power conductors, and a ground conductor are positioned on the substrate in front of the pixel select conductors. A plurality of sample and hold capacitors coupled to the pixel output lines are positioned vertically and/or horizontally on the substrate in front of the ground conductor.

System for reducing sensor area in a back side illuminated CMOS active pixel sensor

A CMOS image sensor implementing a low noise active reset operation uses control circuitry outside a pixel sensor array and transistors in a pixel sensor as parts of an amplifier that charges a photodiode node. In one configuration, a reference transistor in the control circuit controls a current mirrored to a column line, and each pixel sensor in the corresponding column contains a transistor that acts as half of a differential pair when the row containing the pixel sensor is selected. A 4-transistor pixel sensor can be implemented using only NMOS transistors with PMOS transistors in the control circuitry used to complete an amplifier circuit.

CMOS image sensor with active reset and 4-transistor pixels

A system and method for realizing a multi-camera system having two optical paths with a single processing path for the two optical paths. Such a multi-camera system typically includes a first image-capture device associated with a first optical train wherein the first image-capture device is typically pointed in a first direction (i.e., away from the user). The multi-camera system further includes a second image-capture device having a second optical train wherein the second image-capture device is typically pointed in a second direction (i.e., toward the user). The multi-camera system further includes a single processing block coupled to the first image-capture device and the second image-capture device. The processing block is typically operable to process image data captured at each image-capture device.

Multi-camera system and method having a common processing block

A conductive shield plane electrically isolating the photodiode regions from metal interconnect lines in an imager sensor device.

Capacitance noise shielding plane for imager sensor devices

A method for compensating for dark current in an image sensor array. In a representative embodiments, the method includes determining a nominal average dark current for the image sensor array, determining location of each pixel in the image sensor array, obtaining a nominal dark current associated with each pixel based on the nominal average dark current and on the location of the pixel, and subtracting the associated nominal dark current from the image signal for each pixel. At least two of the pixels have differing associated nominal dark currents. In other representative embodiments compensation values for dark currents and for differences in channel processing are determined during the same time period.

Dark current/channel difference compensated image sensor

An image sensor device is provided that has an uncovered imaging array of pixels and a covered global reference non-imaging array of pixels. The pixel samples of the global reference non-imaging array are used to remove noise from the pixel samples of the imaging array. The control signals and control lines that are used to sample the pixels of the imaging array are separate from and independent of the control signals and control lines that are used to sample the pixels of the global reference non-imaging array of pixels. For each row of pixels of the imaging array that is sampled, the same row of pixels of the global reference non-imaging array is sampled. The global reference row has no or very few offsets or variations to ensure that noise removal is performed effectively.

Image sensor device having improved noise suppression capability and a method for supressing noise in an image sensor device

An electronic circuit having built-in self testing capabilities for optimizing power consumption. Typically, the electronic circuit includes a component circuit that operates at some known or unknown optimal operating power level. Further, the electronic circuit includes a power supply coupled to the component circuit such that the power supply provides power to the component circuit. Further yet, the electronic circuit includes a test circuit coupled to the component circuit and coupled to the power supply. The test circuit is operable to monitor the power supplied to the component circuit and operable to control the power supply. In an iterative manner, the test circuit reduces the power supplied to the component circuit until the power supplied to the component circuit is operating at the optimal operating power level.

System and method for managing power consumption

A system and a method for correcting erroneous image signals from defective photosensitive pixels utilizes an analog-to-digital converter (ADC) architecture that corrects the erroneous image signals as image signals are being converted from analog signals to digital signals. The erroneous image signals are corrected by limiting the deviation of a given analog image signal from a previously processed image signal.

System and method for correcting erroneous image signals from defective photosensitive pixels during analog-to-digital conversion

A method of sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor. The APS image sensor supports a normal mode of operation and a sub-sampling mode of operation. The method includes providing a plurality of column amplifiers. A row of pixels circuits to sample is selected. Image signals from each pixel circuit in the selected row are routed to a different one of the plurality of column amplifiers when the APS image sensor is in the normal mode of operation. Image signals from a plurality of the pixel circuits in the selected row are routed to one of the plurality of column amplifiers when the APS image sensor is in the sub-sampling mode of operation.

Sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor in a sub-sampling mode

Compact CMOS pixel sensors containing three or four total transistors and four or five control lines provide a high percentage of sensor area for the photodiode that measures light intensity. The CMOS pixel sensors thus have good light sensitivity. The CMOS pixel sensors also provide active reset operations yielding low noise when resetting node voltages. The low transistor count is achieved using the same transistors during both reset operations and readout operation. Reversing the current direction through a pixel sensor during readout allows the row selection transistor to act as a buffer for a transistor having a gate coupled to the photodiode node.

Compact pixel reset circuits using reversed current readout

An optical sensor array includes an array of pixel circuits. Each pixel circuit includes a photo detector and a voltage supply line. The voltage supply line from each pixel circuit is connected to a common node. A voltage supply input configured to be coupled to a voltage supply and to the common node supplies a voltage to each pixel circuit. A sensing circuit coupled to the common node senses signals from the common node and outputs at least one signal representative of an average intensity of light directed onto the array of pixel circuits.

Apparatus and method for obtaining average scene intensity information from a photo detector array

An active pixel sensor arrangement that provides sub-sampling and reset of all pixel cells after sub-sampling. In one embodiment, logic is provided between sampled and non-sampled rows to propagate reset signals to the non-sampled rows when the sampled rows are reset. In another embodiment, reset of non-sampled rows is implemented with control logic.

Active pixel sensor with enhanced reset

An active pixel sensor (APS) circuit which provides enhanced test and signal processing capabilities. APSs usually include pixel cells arranged in an array of rows and columns. Selectably enableable coupling conductors are provided between principal conductors in the array to permit a signal on one principal conductors to propagate to another principal conductors. The principal conductors include row, reset and column conductors. Signal propagation for testing purposes and for normal mode operation are disclosed.

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Corvallis, OR, United States of America

Ray Alan Mentzer