Ebay, Incorporated

Hitachi, Ltd.

Ravneet Kaur

SureshKumar Karuppuchamy

Dineshbabu Bhoopalan

Ashok Balasubramanian

Syed Musthafa Sikkander

Charles Douglas Watkins

Balasubramanian Jayamani

Toshiki Shimizu

Hidenori Omiya

Harish Kumar Krishnasamy

Takahiro Ohira

A method for computing and detecting image data drift. The method may include retrieving first segment information of a plurality of segments from a drift database; receiving a number of images from a sensor; partitioning each of the received images into segments of a predetermined number; generating second segment information; computing drift in values between the first segment information and the second segment information; and detecting drift based on the computed drift in values by combining the computed drift in segments to generate overall drift, and comparing the overall drift against a drift threshold.

Method to compute drift in image data before ml model inference

Systems and methods for providing warehousing services that utilize a machine learning model are provided. The system trains a machine learning model with training data comprising item attributes and transaction locations extracted from past transactions for each item category to identify a plurality of transaction zones where each item category has a highest probability for selling. Subsequently, the system receives a warehouse request to warehouse inventory in a remote location. At least one transaction zone is determined based on item attributes of the inventory by applying the trained machine learning model. Based on the determined at least one transaction zone, the system determines one or more warehouse spaces that satisfy a spacing requirement for the inventory and causes presentation of the warehouse recommendation. The warehouse recommendation can indicate the one or more warehouse spaces.

System and method for providing warehousing service

Growing community of inventors

San Jose, CA, United States of America

Ravneet Kaur