Apple Inc.

Broadlight Ltd.

Medical Research & Development Associates

Raviv Weber

Alexander Shpunt

Naftali Chayat

Yuval Gerson

Raviv Erlich

Amiad Dvir

Alexander Sromin

David Avishai

Alex Goldstein

Igor Elkanovich

Eli Elmoalem

Asaf Koren

Gal Sitton

Moshe Levy

Michael Balter

Rafi Dvir

An integrated photonic module includes a semiconductor substrate configured to serve as an optical bench. Alternating layers of insulating and conducting materials are deposited on the substrate and patterned so as to define electrical connections. An optoelectronic chip is mounted on the substrate in contact with the electrical connections. A drive chip is mounted on the substrate so as to provide an electrical drive current to the optoelectronic chip via the electrical connections.

Active silicon optical bench

Optical apparatus () includes a stator assembly (), which includes a core () containing an air gap and one or more coils () including conductive wire wound on the core so as to cause the core to form a magnetic circuit through the air gap in response to an electrical current flowing in the conductive wire. A scanning mirror assembly () includes a support structure (), a base (), which is mounted to rotate about a first axis relative to the support structure, and a mirror (), which is mounted to rotate about a second axis relative to the base. At least one rotor () includes one or more permanent magnets, which are fixed to the scanning mirror assembly and which are positioned in the air gap so as to move in response to the magnetic circuit. A driver () is coupled to generate the electrical current in the one or more coils.

Dual-axis scanning mirror

A method for sensing includes connecting an input of a trans-impedance amplifier (TIA) to a first terminal of a sensor, which generates a current in response to an input signal that is incident on the sensor, the signal comprising pulses of a characteristic duration. A resistor is connected in series between a second terminal of the sensor and a power supply, which is set to drive the sensor at a selected voltage. A capacitor is connected to the second terminal in parallel with the sensor and the TIA and in series with the resistor. An upper limit is set on the current that is to be input to the TIA from the sensor, and respective values of the resistor and the capacitor are chosen, responsively to the characteristic duration of the pulses and the selected voltage, to prevent the current input to the TIA from exceeding the upper limit.

Overload protection for amplifier of photodiode signal

Burst mode clock and data recovery (BCDR) circuit and method capable of fast data recovery of passive optical network (PON) traffic. An over-sampled data stream is generated from an input burst data signal and a phase interpolator generates sampling clock signals using a reference clock and phase information. A phase estimation unit (PEU) determines a phase error in the over-sampled data streams; and a phase retrieval unit sets the phase interpolator with the respective phase information of the input burst data signal prior to reception of the input burst data signal.

Burst mode clock and data recovery circuit and method

Apparatus and method to measure the quality of burst signals and to perform optical line diagnostics in and optical passive optical network (PON). Statistical information about phase noise (jitter), signal distortion, clock distortions, and any other effects present in burst signals is generated. The statistics are based on phase and bit-length distortions, direction and length of the effect as detected by a phase error detector integrated in a burst mode clock and data recovery (BCDR) circuit. The invention can be further adapted to perform optical line diagnostics to detect the root cause performance degradation and failures in the PON, thereby providing an optical layer supervision tool for monitoring the PON. The statistical information can be used to estimate the quality of service (QoS) per customer connected to the PON. In addition, the generated statistic information can be used to calibrate transmission parameters of optical network unit (ONU) transmitters.

Apparatus and method for measuring the quality of burst signals and performing optical line diagnostics

A circuit for detecting optical failures in a passive optical network (PON) wherein digital burst data transmitted by an optical transmitter is monitored by a photodiode, includes a power determination unit coupled to the photodiode for providing measurements of an output optical power of a high logic level and a low logic level of the digital burst data during ON times of the optical transmitter and for providing a measurement of an output optical power during OFF times of the optical transmitter. A logic unit coupled to the power determination unit is responsive to the measurements for generating control and calibration signals. Such a circuit may be used for detecting rogue optical network unit (ONU) failure or eye safety hazards in a passive optical network (PON) wherein digital burst data transmitted by an optical transmitter is monitored by a photodiode.

Circuit for detecting optical failures in a passive optical network

A transimpedance amplifier (TIA) circuit usable for burst mode communications is provided. The TIA circuit includes a TIA stage, a limiter-amplifier, and a DC restoration loop. The invention overcomes problems of the prior art relating to burst communications, such as a DC level in the output signal which can change from burst to burst and a duty-cycle distortion in large signals. This is achieved by using a DC restoration loop that ensures achieving zero DC potential within variable acquisition periods.

Transimpedance (TIA) circuit usable for burst mode communications

Hyperthermia apparatus including a power amplifier, remote electrode apparatus receiving a high power electrical supply from the power amplifier, power transmission apparatus arranged to electrically couple the power amplifier to the remote electrode apparatus for supply of electrical power thereto and capacitive matching apparatus for providing real time capacitive matching between the power amplifier and the capacitive load across the electrode apparatus.

Growing community of inventors

Herzliya, Israel

Raviv Weber