Thermo Fisher Scientific Gmbh

Fisons Ltd.

Thermo Fisher Scientific (ecublens) Sarl

Ravisekhar Yellepeddi

Lee Grodzins

Pierre-Yves Negro

Alexandre Bapst

Michel Bonzon

The invention provides an apparatus and a method of performing X-ray diffraction (XRD) and/or X-ray fluorescence (XRF) analysis of a sample, comprising: irradiating a sample with X-rays from an X-ray source; providing a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector; and performing XRD analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample using the scanning wavelength selector and detecting X-rays of the selected fixed wavelength(s) at one or more values of the diffraction angle &#x3c6; at the sample using the X-ray detector(s); and/or performing XRF analysis of the sample by scanning wavelengths of X-rays emitted by the sample using the scanning wavelength selector and detecting X-rays of the scanned wavelengths using the X-ray detector(s).

Method and apparatus for performing X-ray analysis of a sample

An apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample. A sample holder is located within an evacuable chamber. An x-ray fluorescence source and separate x-ray diffraction source are mounted within the evacuable chamber. An XRF detection arrangement is also provided, for detecting secondary x-rays emitted from the surface of the crystalline sample as a result of illumination by x-rays from the said x-ray fluorescence source. An XRD detection arrangement is then provided for detecting x-rays of a characteristic wavelength which have been diffracted by the crystalline sample. A moveable XRD support assembly is provided, comprising a first part configured to mount the XRD source for relative movement between the XRD source and the sample holder, and a second part configured to mount the XRD detection arrangement for relative movement between the XRD detection arrangement and the sample holder.

X-ray analysis instrument

An analytical instrument is disclosed having both XRF and spark emission spectroscopy capabilities. In a particularly advantageous embodiment, a field portable XRF device is removably coupled to the instrument by means of a docking station. A first surface of the sample is irradiated with an X-ray beam, and the X-ray radiation fluorescently emitted from the sample is detected and analyzed to acquire elemental composition data. The instrument is further provided with a spark source located proximal a second surface of the sample and a detector for sensing the radiation emitted from the spark-excited material. The combined instrument enables the acquisition of complementary elemental composition data by XRF and spark emission spectroscopy without having to transport a sample between separate instruments.

Instrument having X-ray fluorescence and spark emission spectroscopy analysis capabilities

A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is illuminated with x-rays; one or more fluorescence channels (17), able to select x-rays of a particular wavelength and energy and having means (20) for detecting said selected x-ray; a diffraction channel (28) able to select a characteristic x-ray wavelength at said source (11) following diffraction of the x-rays by said sample (14) and having means (33) for detecting a selected characteristic x-ray; and an actuating means (32) for controlling arcuate movement of said diffraction channel (28) relative to said sample (14) so as to detect x-rays leaving the sample at different diffraction angles.

Growing community of inventors

Chavornay, Switzerland

Ravisekhar Yellepeddi