Qualcomm Incorporated

Ravi Rajagopalan

Thomas Philip Speier

James Norris Dieffenderfer

Brian Stempel

David Scott Ray

Jason Lawrence Panavich

Clint Wayne Mumford

Niket Choudhary

Pritha Ghoshal

Anand Krishnamurthy

Patrick Eibl

Ketan Vitthal Patel

A method, apparatus, and system for reducing pipeline stalls due to address translation misses is presented. An apparatus comprises a memory access instruction pipeline, a translation lookaside buffer coupled to the memory access instruction pipeline, and a TLB miss queue coupled to both the TLB and the memory access instruction pipeline. The TLB miss queue is configured to selectively store a first memory access instruction that has been removed from the memory access instruction pipeline as a result of the first memory access instruction missing in the TLB along with information associated with the first memory access instruction. The TLB miss queue is further configured to reintroduce the first memory access instruction to the memory access instruction pipeline associated with a return of an address translation related to the first memory access instruction.

Method, apparatus, and system for reducing pipeline stalls due to address translation misses

The content and order of a predetermined sequence of hard-coded and/or quasi-programmable test patterns may be altered during a Built-In Self-Test (BIST) routine. As such, knowledge gained post design completion may be reflected in the selection and arrangement of available tests to be executed during a BIST routine. In one embodiment, a sequence of hard-coded and/or quasi-programmable tests is executed during a BIST routine by receiving test ordering information for the sequence of tests and executing the sequence of tests in an order indicated by the test ordering information. A corresponding BIST circuit comprises a storage element and a state machine. The storage element is configured to store test ordering information for the sequence of tests. The state machine is configured to execute the sequence of tests in an order indicated by the test ordering information.

Method and apparatus for scheduling BIST routines

Techniques for controllably allocating a portion of a plurality of memory banks as cache memory are disclosed. To this end, a configuration tracker and a bank selector are employed. The configuration tracker configures whether each memory bank is to operate in a cache or not. The bank selector has a plurality of bank distributing functions. Upon receiving an incoming address, the bank selector determines the configuration of memory banks currently operating as the cache and applies an appropriate bank distributing function based on the configuration of memory banks. The applied bank distributing function utilizes bits in the incoming address to access one of the banks configured as being in the cache.

Methods and apparatus for dynamically managing banked memory

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Cary, NC, United States of America

Ravi Rajagopalan