Digital Equipment Corporation

Ravi Nene

William F Bruckert

Thomas D Bissett

David E Kovalcin

Method and apparatus for testing the operation of modules for use in a fault tolerant computing system that consists of two distinct computing zones. Diagnostic testing is performed when the system is powered on, the modules being subjected to module, zone and, if both zones are available, system diagnostic tests. Indications of faults detected during diagnostic testing are stored in an EEPROM on each module. Such fault indications can be cleared in the field by correcting the fault condition and successfully rerunning the diagnostic test during which the fault was detected. Indications of operating system detected faults are also stored in each module EEPROM. However, such fault indications are not field clearable.

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Chelmsford, MA, United States of America

Ravi Nene