Max-planck-gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Carl Zeiss Microscopy Gmbh

Karlsruher Institut Fur Technologie

Ruprecht-karls-universitaet Heidelberg

Rasmus Schroeder

Martin Edelmann

Ulrich Gengenbach

Andreas Schertel

Leonard J Ness

Andreas Hofmann

Julian Hoffmann

Alexandra F Elli

Warren J P Brey

Physiker Bastian Barton

Waldemar Spomer

Irene Wacker-Schroeder

A microtome for producing thin sections from a sample includes a sample holder configured to receive the sample and a cutting edge configured to cut the sample, the cutting edge having a specified cutting direction, the cutting direction and the cutting edge spanning a cutting plane. The microtome further includes a movement device configured to produce a relative movement between the sample holder and the cutting unit for cutting the sample in the cutting direction, a feed device configured to produce a relative movement between the sample holder and the cutting edge for cutting the sample in a feed direction at an angle not equal to 0&#xb0; to the cutting plane, and a liquid volume with a liquid abutting the cutting edge on a side of the cutting edge facing away from the sample holder.

Microtome and method for producing thin sections from a sample by means of a microtome

Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.

FIB-SEM array tomography

The invention concerns a phase plate, in particular for an electron microscope, which is disposed in an electron beam path (), comprises at least one thin film (-), which thin film is at least partially permeable to electron beams, wherein the thin film (-) comprises electrically conductive material, is connected to a predeterminable electrical voltage (-) and is equipped with at least one through-hole (-).

Phase plate, in particular for an electron microscope

Growing community of inventors

Heidelberg, Germany

Rasmus Schroeder