Agency for Science, Technology and Research

Illinois Tool Works Inc.

Ranjan S/o Rajoo

Ee Hua Wong

Kuo Tsing Tsai

Kah Woon Seah

A micro-impact testing apparatus for measuring the impact characteristics of a microelectronics specimen exposed to an impact thereon. The apparatus comprises of a specimen holder for receiving a specimen to be tested, and an impact device. The impact device comprises of an impact head, a support member, at least one connecting element and a first flexural spring. The support member is connected to the connecting element in that the first flexural spring is firmly attached with its one end to the support member and with its other end to the connecting element. A second flexural spring, being at least substantially identical to said first flexural spring, is firmly attached with its one end to the connecting element and with its other end to the impact head so that the ends of the first and second flexural springs define, in an unloaded state of the flexural springs, a rectangle. The impact head is moveable transversally with respect to the first and second flexural springs along a linear line between a spring-loaded position and an impact position thereof. The specimen holder is aligned with the impact device such that the specimen is arranged in said impact position of the impact head so that the impact head is capable of impacting on the specimen after traveling from its loaded position towards its impact position along said linear line upon release thereof from said loaded position.

Micro-impact testing apparatus

A bend testing apparatus for simulating free vibrational flexing at high speeds and frequencies in a test specimen, said apparatus comprising a cam having a narrow circumferential profile or linear profile wherein at least one portion of the profile of said cam comprises at least one waveform, a specimen holder that holds the test specimen on opposite ends of the test specimen in a default position, a light-weight deformation member operable to deflect at least one point on the test specimen from the default position, a follower with one end in operable contact with the cam and its other end connected to the deformation member, such that a displacement of the follower is according to the profile of the cam, to actuate the deformation member correspondingly and to deflect the at least one point on the test specimen from said default position upon movement of the cam.

Growing community of inventors

Singapore, Singapore

Ranjan S/o Rajoo