Dallas Semiconductor Corporation

Ranganath Bagade

Titkwan Hui

Douglas Gene Cole

A temperature compensated crystal oscillation circuit adapted to be contained within a small device package and providing an output frequency accuracy of approximately &plus;/&minus;2 ppm over a temperature range or less than 2 minutes per year over the temperature range. The device includes crystal and a single integrated circuit wherein the integrated circuit has a temperature sensing circuit with a digital output, control circuitry, a memory circuit and a switched capacitor array for compensating the oscillation of the crystal oscillator over temperature.

Method for calibrating a temperature sensitive oscillator

Single package temperature compensated electronic device

A temperature compensated crystal oscillation circuit adapted to be contained within a small device package and providing an output frequency accuracy of approximately +/-2 ppm over a temperature range or less than 2 minutes per year over the temperature range. The device includes crystal and a single integrated circuit wherein the integrated circuit has a temperature sensing circuit with a digital output, control circuitry, a memory circuit and a switched capacitor array for compensating the oscillation of the crystal oscillator over temperature.

Temperature compensated crystal oscillator

A temperature compensated crystal oscillation circuit adapted to be contained within a small device package and providing an output frequency accuracy of approximately +/-2 ppm over a temperature range or less than 2 minutes per year over the temperature range. The device includes a crystal and a single integrated circuit wherein the integrated circuit has a temperature sensing circuit with a digital output, control circuitry, a memory circuit and a switched capacitor array for compensating the oscillation of the crystal oscillator over temperature.

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Dallas, TX, United States of America

Ranganath Bagade