Honeywell International Inc.

Microvision, Inc.

Alliedsignal Inc.

L-3 Communications Corporation

Randy Sprague

Rand H Hulsing, Ii

Mark O Freeman

Margaret K Brown

John R Lewis

David Skurnik

Eric Charles Abbott

Harpal Singh Sira

Jim Bovee

James Michael McLaughlin

A scan assembly of an image generator sweeps an image beam in a first dimension at a first rate and bi-directionally in a second dimension at a slower rate. Sweeping the beam bi-directionally in the vertical dimension (generally the dimension of the lower sweep rate) can reduce the scanning power by eliminating the flyback period, and, where the scan assembly includes a mechanical reflector, can reduce the error in the beam position without a feedback loop by reducing the number of harmonics in the vertical sweep function. Furthermore, because the image beam is 'on' longer due to the elimination of the flyback period, the scanned image is often brighter for a given beam intensity. The scan assembly may also sweep the image beam non-linearly in the vertical dimension, and this sweep may be bi-directional or uni-directional. Sweeping the beam non-linearly can also reduce the error in the beam position by reducing the number of harmonics in the vertical sweep function.

Apparatus and method for bi-directionally sweeping an image beam in the vertical dimension and related apparati and methods

A circuit for detecting a phase error between a clock signal and a beam position includes a beam generator, a sensor, and a phase detector. The beam generator directs a beam toward a beam sweeper in response to the clock signal, and the sensor detects the beam as directed from the beam sweeper. The phase detector determines from the detected beam the error in the clock phase relative to the beam position. Such a circuit can automatically detect the phase error in the pixel clock and correct this error, thus eliminating the need for a manual phase-error corrector. The circuit may also be able to adjust the width and/or the height of a scan region, and thus may also be able to adjust the width and/or height of an image frame within the scan region.

Circuit for detecting a clock error in a scanned-image system and related circuits, systems, and methods

Performance-enhancing, reduced-area metalization adhesion areas in force-sensing transducers are described.

Force-sensing transducers, accelerometers, rate sensors, methods of forming force-sensing transducers, and methods of forming vibrating-beam force transducers

A method for improving the performance of a micromachined device, preferably an angular rate microsensor, is provided. The method includes collecting data on rate bias over a selected operating phase demodulation angles for at least one tine of a microsensor and determining optimum settings for phase demodulation angles at which the rate bias hysteresis over temperature is at a minimum by applying dynamic programming.

Method for improving the performance of micromachined devices

Low metalization creep sensor

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Carnation, WA, United States of America

Randy Sprague