Growing community of inventors

St. Louis, MO, United States of America

Randall K Rader

Average Co-Inventor Count = 7.13

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 5

Randall K RaderBrad D White (3 patents)Randall K RaderGovind Chaudhary (3 patents)Randall K RaderKevin Lee Deppermann (1 patent)Randall K RaderJason Kendrick Bull (1 patent)Randall K RaderRichard Hall Sheetz (1 patent)Randall K RaderBrian J Forinash (1 patent)Randall K RaderAnju Gupta (1 patent)Randall K RaderEric L Borrowman (1 patent)Randall K RaderJeffrey Lawrence Kohne (1 patent)Randall K RaderChi Zhang (1 patent)Randall K RaderJohnny J Kotyk (1 patent)Randall K RaderJohn J Kotyk (1 patent)Randall K RaderHsin-Chen Chen (1 patent)Randall K RaderChi Zhang (1 patent)Randall K RaderLouis M Pompe Van Meerdevoort (1 patent)Randall K RaderKolbyn S Joy (1 patent)Randall K RaderLouis M Pompe Van Meerdervoort (1 patent)Randall K RaderRandall K Rader (3 patents)Brad D WhiteBrad D White (10 patents)Govind ChaudharyGovind Chaudhary (6 patents)Kevin Lee DeppermannKevin Lee Deppermann (89 patents)Jason Kendrick BullJason Kendrick Bull (31 patents)Richard Hall SheetzRichard Hall Sheetz (25 patents)Brian J ForinashBrian J Forinash (15 patents)Anju GuptaAnju Gupta (11 patents)Eric L BorrowmanEric L Borrowman (11 patents)Jeffrey Lawrence KohneJeffrey Lawrence Kohne (9 patents)Chi ZhangChi Zhang (8 patents)Johnny J KotykJohnny J Kotyk (4 patents)John J KotykJohn J Kotyk (2 patents)Hsin-Chen ChenHsin-Chen Chen (2 patents)Chi ZhangChi Zhang (2 patents)Louis M Pompe Van MeerdevoortLouis M Pompe Van Meerdevoort (1 patent)Kolbyn S JoyKolbyn S Joy (1 patent)Louis M Pompe Van MeerdervoortLouis M Pompe Van Meerdervoort (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Monsanto Technology LLC (3 from 6,954 patents)


3 patents:

1. 11673166 - Seed imaging

2. 11238393 - Yield monitoring systems and methods

3. 10557805 - High throughput methods of analyzing seed cotton using X-ray imaging

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as of
12/6/2025
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