Continuse Biometrics Ltd.

Ran Califa

Zeev Zalevsky

Javier Garcia

Yevgeny Beiderman

Nisim Nisan Ozana

Moshe Arie Ariel Schwarz

Mark Golberg

Zeev Markman

Sagi Polani

Hadar Genish

Michael Shegei

The present invention relates to a novel optical approach based on spatial analysis of spatial laser speckle patterns for tissue in-depth flow inspection characteristics. In particular, the invention relates to a technique for determining flow characteristics and identifying low blood flow or a blockage in blood vessels.

System and method for depth flow inspection

A system for use in monitoring application is described. The system comprises a light detection unit and an illumination arrangement. The detection unit is configured for collecting light returning from a selected inspection region for determining variations in collected light intensity. The illumination arrangement comprises one or more light sources configured for providing illumination of a selected wavelength range directed toward said inspection region. Wherein the illumination arrangement is arranged around the detection unit to provide symmetrical illumination conditions with respect to an axis connecting said detection unit and said inspection region.

System and method for use in photoplethysmography

A system and technique are described, for use in optical monitoring of objects. The system comprising: a collection unit comprising at least one optical arrangement and at least one detector array arranged for defocused collection of light returning from a selected region on the object; and image data collection circuitry configured for receiving electronic signals associated with data piece collected by pixels of the at least one detector array and for generating output data indicative of correlation function between image frames collected by the detector array at two or more different temporal instances. The technique thereby enables determining of correlation between image data pieces with reduced computational complexity.

System and method for monitoring a sample

A system and corresponding method are presented. The system includes an illumination unit including at least one light source configured for emitting coherent illumination of one or more selected wavelength ranges having selected illumination modulation pattern and for directing the coherent illumination onto one or more selected inspection regions; and a collection unit including at least one detector array and imaging optical arrangement configured for collecting interacting light from the one or more selected inspection regions and for generating corresponding one or more sequences of image data pieces at selected sampling rate. The image data pieces are indicative of secondary speckle patterns formed in collected interacting light. The illumination modulation pattern is selected for increasing temporal bandwidth collection of speckle patterns associated with temporal shifts in the one or more inspection regions.

Sample inspection utilizing time modulated illumination

A system is described, for use in optical measurement of a sample. The system comprising: an illumination unit configured for providing coherent illumination of one or more selected wavelength ranges and directing it onto one or more selected inspection regions of the sample, a collection unit configured for collecting light returning from the inspection region and generating output data comprising a sequence of image data pieces indicative of secondary speckle patterns formed at an intermediate plane in optical path of light collection, a depth resolving module configured for affecting at least one of the illumination unit and the collection unit for determining an association between collected secondary speckle patterns and depth layers of the sample; and a control unit being connectable to said depth resolving module and configured for operating said depth resolving module and for receiving said sequence of image data pieces from the collection unit and processing said sequence of image data pieces by determining correlation functions between at least portions of said secondary speckle patterns associated with corresponding depth layers of the sample, thereby determining one or more parameter variations along depth of the sample.

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Givataym, Israel

Ran Califa