Cypress Semiconductor Corporation

Ramin Ighani

Anup Nayak

Navaz M Lulla

Roger J Bettman

Sanjeev Kumar Maheshwari

Rajiv Nema

An integrated circuit including a first cell configured to perform boundary scan testing, and an I/O node coupled to the first cell, wherein the I/O node is configured to carry a first differential signal. A level translator may be coupled between the I/O node and the first cell, wherein the level translator is configured to translate the first differential signal into a single ended signal. A level translator may be coupled between the I/O node and the first cell, wherein the level translator is configured to translate a single ended signal into the first differential signal. Core logic may be coupled to the first cell, wherein the core logic is configured to process a second differential signal, and a level translator may be coupled between the core logic and the first cell, wherein the level translator is configured to translate the second differential signal into a single ended signal.

Boundary scan register for differential chip core

A programmable logic device comprising a macro-cell flip-flop configured to store (i) a first input when the programmable logic device is in a normal mode and (ii) a second input when the programmable logic device is in a test mode.

Macro-cell flip-flop with scan-in input

An apparatus comprising one or more configuration blocks. The configuration blocks (i) may comprise a number of configuration elements and (ii) may be configured to initiate reading or writing of the configuration elements in response to a control input.

PLD configuration architecture

A programmable logic device comprising one or more first stages and one or more second stages. The one or more first stages may comprise one or more gates of a first type each having a first number of inputs. The one or more second stages may comprise one or more gates of a second type each having a second number of inputs, wherein said first and second stages are interlaced.

Degenerate network for PLD and plane

An apparatus comprising a first circuit and a second circuit. The first circuit may be configured to (i) generate one or more first parallel data signals in response to a first serial data stream and a first control signal and (ii) generate a second serial data stream in response to one or more second parallel data signals and a second control signal. The second circuit may be configured to write the one or more first parallel data signals to and read the one or more second parallel data signals from an array of storage elements in response to one or more control signals.

Configuration bit read/write data shift register

An apparatus comprising a first circuit and a second circuit. The first circuit may be configured to drive a first bus in response to a first control signal. The second circuit may be configured to control a voltage of the first bus in response to the first control signal.

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Santa Clara, CA, United States of America

Ramin Ighani