Mentor Graphics Corporation

Rami Fathy Salem

Mohamed Dessouky

Haitham Mohamad Abd ElHamid Eissa

Walid Farouk Mohamed

Ahmed Arafa

Haitham Mohamed Eissa

Sherif Hany Mousa

Mohamed Al-Imam Mohamed Selim

Abdelrahman ElMously

Disclosed are techniques for detecting hotspots using parameter matching. According to various implementations of the invention, devices in an electronic circuit design are classified into device groups based on their values for one or more device parameters, which can be derived from layout data describing the devices. Representative electrical information for each of the device groups is determined and used as a basis for hotspot detection.

Parameter matching hotspot detection

Aspects of the invention relate to techniques for detecting and correcting electrical hotspots in a layout design for a circuit design comprising an analog circuit. Layout parameters for device instances associated with electrical constraints are first extracted. Based on the extracted layout parameters, electrical parameter variations for the device instances may be computed to identify one or more electrical hotspots in the layout design. A sensitivity analysis of the one or more electrical hotspots is performed to generate repair hints. Based on the repair hints, the layout design is adjusted.

Electrical hotspot detection, analysis and correction

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Windsor, CA, United States of America

Rami Fathy Salem