Netlogic Microsystems, Inc

Ramesha Doddamane

Gopalakrishnan Perur Krishnan

Tarjinder Singh

Eswar Vadlamani

A built-in self-test (BIST) circuit for testing addressable locations can include a BIST generator () that can generate test addresses for testing each addressable location. Defective addresses can be stored in a fault address store (). An address range selector circuit () can limit the range of addresses generated by an address generator (). Once defective addresses for a first range have been detected, an address range selector circuit () can test another range. An entire address range can thus be tested regardless of the depth of a fault address store ().

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Hyderabad Telangana, India

Ramesha Doddamane