Intel Corporation

Ramakrishna Mallela

Theodore Zale Schoenborn

David Zimmerman

Bruce Querbach

David G Ellis

William K Lui

Christopher W Hampson

Ifar Wan

Yulan Zhang

David J Zimmerman

In accordance with the present description, a device includes an internal defect detection and repair circuit which includes a self-test logic circuit built in within the device and a self-repair logic circuit also built in within the device. In one embodiment, the built in self-test logic circuit may be configured to automatically identify defective memory cells in a memory. Upon identifying one or more defective memory cells, the built in self-repair logic circuit may be configured to automatically repair the defective memory cells by replacing defective cells with spare cells within the memory.

Integrated circuit defect detection and repair

Growing community of inventors

Hillsboro, OR, United States of America

Ramakrishna Mallela