Adv Antest Corporation

Advantest America R&d Center, Inc.

Ramachandran Krishnaswamy

Ankan Pramanick

Mark Elston

Toshiaki Adachi

Leon Chen

Harsanjeet Singh

Hironori Maeda

Chandra Pinjala

Yoshihumi Tahara

A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.

Using shared pins in a concurrent test execution environment

Test program development for a semiconductor test system, such as automated test equipment (ATE), using object-oriented constructs is described. The invention provides a method for describing test system resources, test system configuration, module configuration, test sequence, test plan, test condition, test pattern, and timing information in general-purpose object-oriented constructs, e.g., C++ objects and classes. In particular, the modularity of program development is suitable for developing test programs for an open architecture semiconductor test system.

Method and structure to develop a test program for semiconductor integrated circuits

A method for developing a test program for a semiconductor test system is disclosed. The method includes describing a test plan file in a test program language (TPL), where the test plan file describes at least one test of the test program, describing a test class file in a system program language (SPL) and a corresponding pre-header file of the test class file in the TPL, where the test class file describes an implementation of the at least one test of the test program, and generating the test program using the test plan file, the test class file, and the pre-header file.

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Cupertino, CA, United States of America

Ramachandran Krishnaswamy