International Business Machines Corporation

Ralph Richard Comulada, Jr

Keith C O'Neil

Kurt A Smith

John Peter Karidis

Gerard McVicker

Michael Philip Goldowsky

Yuet-Ying Yu

Brenda Lee Peterson

Robert Albert Meyen

Randall Jason Werner

Thomas Ramundo

Daniel T Langdon

Screening of a workpiece utilizing a screening apparatus which includes a paste dispensing apparatus and a trailing squeegee assembly in close proximity to the paste dispensing apparatus. When the screening apparatus is operable, the squeegee assembly is in contact with the workpiece at the same time as a paste is dispensed from the paste dispensing apparatus.

Screening apparatus with trailing squeegee and method of screening

A method for displacing an article using first and second pallets for holding and transporting an article between two process stations and an H-bar assembly for receiving the first and second pallets, the method including the steps of: receiving the first and second pallets and articles thereon by the H-bar assembly at one of the two process stations; performing a first process on the articles while received by the H-bar assembly; moving the first and second pallets and articles thereon to a second process station; and performing a second process on the articles while at the second process station.

Method for displacing an article during screening

An apparatus for displacing an article including first and second pallets for holding and transporting an article between two process stations; an H-bar assembly for receiving the first and second pallets at one of the two process stations; wherein, in operation, a process is performed on the articles while the first and second pallets are received by the H-bar assembly, the pallets then being transported to the second process station where a second process is performed on the articles.

Apparatus for displacing an article during screening

Disclosed is an improved probe housing mechanism that will allow for the quick release of a probe tip from a testing tool. The invention includes a probe housing, a double cantilevered beam for holding a probe tip, and a releasable spring mechanism for holding the beam into place. The spring mechanism can be released by squeezing the spring together or by releasing a non-removable locking screw, thereby allowing the beam to be slidably removed from the probe housing for easy replacement.

Electrical test tool having easily replaceable electrical probe

Growing community of inventors

Rock Tavern, NY, United States of America

Ralph Richard Comulada, Jr