Carl Zeiss Jena Gmbh

Carl Zeiss Microscopy Gmbh

Carl Zeiss Microimaging Gmbh

Ralph Lange

Torsten Antrack

Johannes Winterot

Matthias Reich

Stefan Wilhelm

Thomas Egloff

Frank Hecht

Martin Voelcker

Alexander Scheps

Volker Gerstner

Ulrich Meisel

Harald Schadwinkel

Rebecca Elsässer

Emmanuel G Reynaud

Helmut Bloos

Winfried Wiegraebe

The invention relates to an optical arrangement and a method for correcting centration errors and/or angle errors in a beam path. The beam path here comprises an optical compensated system in which at least two optical elements are present and aligned relative to one another such that imaging aberrations of the optical elements are compensated. According to the invention, a correction unit is arranged in an infinity space of the beam path and between the at least two optical elements, wherein the correction unit changes the propagation direction of radiation propagating along the beam path and the correction unit either has a reflective surface or is embodied to be transmissive for the radiation. The correction unit is movable such that the angle of a change in the propagation direction can be set.

Optical arrangement and method for correcting centration errors and/or angle errors

An adapter is useful with a sample holder of a microscope. The adapter has at least one support region for reproducibly orienting the adapter in a mounted state in a sample holder support. The adapter also has a first coupling point for detachable connection to a coupling structure of a sample holder on one side, and a second coupling point for detachable connection to a coupling structure of a sample manipulator on a side of the adapter opposite to the first coupling point. The adapter is useful with the sample holder, a sample chamber, a microscope and a method for arranging a sample in a detection beam path of a microscope.

Adapter for use with a sample holder, and method for arranging a sample in a detection beam path of a microscope

An arrangement in the illumination beam path of a laser scanning microscope, comprising a mirror which can be introduced into the beam path for coupling in at least one additional wavelength, and a method for the operation of a laser scanning microscope with a mirror which can be swiveled in rapidly for coupling at least one additional wavelength into the illumination beam path, wherein the swiveling process is synchronized with the illumination control by a control unit in such a way that at least one additional wavelength is coupled into the illumination beam path when the mirror is swiveled out.

Arrangement in the illumination beam path of a laser scanning microscope

A method and arrangement are disclosed for increasing the depth contrast in microscope imaging. The method and implementation described can be designated as structured illumination for generating quasi-confocal optical sections. In implementing the method, a grating structure located in the field diaphragm plane of a microscope, the object plane and the TV intermediate image plane of a microscope are arranged confocally. The term &ldquo;confocally&rdquo; refers to the fact that the grating, object and the intermediate image plane are positioned on optically conjugate planes. By this arrangement, the grating structure is projected in the object plane of the microscope and the object which is structured in this way is imaged in the TV intermediate image plane of the microscope by the optical system following it. Optical sections are generated by calculating the modulation depth of the structured object. Three-dimensional acquisition of the object is achieved in that the object is imaged in a plurality of focus planes at right angles to the direction of observation and is detected using an array detector (e.g., CCD camera). The method and implementation of structured illumination described herein can primarily be used in reflection microscopy and fluorescence microscopy. In principle, the method can be applied for all linear interactions between light and matter. The use of the method is likewise not limited to the field of microscopy.

Assembly for increasing the depth discrimination of an optical imaging system

Near-field optical microscope with a probe tip which is arranged on one side of a light-transmitting specimen and moved in a scanning manner. The probe tip serves as a point light source. Optics for collecting light transmitted through the specimen and transmitting it to a detection unit or for collecting illumination light are provided on the other side of the specimen. The movement of the probe tip is adapted to on the detection side, or the probe serves to detect specimen light. A detection unit is arranged following the probe in the direction of illumination, and a scanning illumination adapted to the probe movement is carried out on the other side of the specimen.

Optical near-field microscope

An illumination device for a light microscope comprises a scanning microscope probe which is integrated in the center thereof. A scanning probe microscope comprising such illumination device is also disclosed.

Scanning probe microscope with probe integrated in an optical system

Growing community of inventors

Jena, Germany

Ralph Lange