Growing community of inventors

Melle, Germany

Ralph Klose

Average Co-Inventor Count = 1.43

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 24

Ralph KloseRoland Böhm (1 patent)Ralph KloseMarius Thiel (1 patent)Ralph KloseMarius Thiel (1 patent)Ralph KloseJörg Klever (1 patent)Ralph KloseRoland Boehm (1 patent)Ralph KloseArno Neumeister (1 patent)Ralph KloseMarius Thiel (1 patent)Ralph KloseRalph Klose (10 patents)Roland BöhmRoland Böhm (4 patents)Marius ThielMarius Thiel (3 patents)Marius ThielMarius Thiel (3 patents)Jörg KleverJörg Klever (2 patents)Roland BoehmRoland Boehm (1 patent)Arno NeumeisterArno Neumeister (1 patent)Marius ThielMarius Thiel (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Citex Holding Gmbh (4 from 12 patents)

2. Inoex Gmbh Innovationen Und Ausruestungen Fuer Die Extrusionstechnik (3 from 5 patents)

3. Inoex Gmbh Innovationen Und Ausrustungen Fur Die Extrusionstechnik (2 from 4 patents)

4. 1noex Gmbh Innovationen Und Ausrüstungen Für Die Extrusionstechnik (1 from 1 patent)


10 patents:

1. 12265022 - THz measuring device and THz measurement method for measuring test objects, in particular pipes

2. 12253350 - THz measurement method and THz measurement device for measuring a measurement object

3. 12105021 - THz measuring device and method for measuring a measuring object

4. 11999576 - Suction conveying apparatus and method for suction conveying of bulk material

5. 11971350 - Method and THz measuring device for measuring a measurement object using electro-magnetic radiation

6. 11874105 - Measurement system and method for measuring a measurement object, in particular a plastic profile

7. 11835467 - THz measuring device and THz measuring method for determining defects in measuring objects

8. 10753727 - Terahertz measurement device

9. 10753866 - Terahertz measuring apparatus and terahertz measurement method for measuring a test object by means of a time-of-flight measurement

10. 10584957 - Terahertz measurement method and terahertz measuring apparatus for ascertaining a layer thickness or a distance of a measurement object

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