Southwire Company, LLC

Ut-battelle, Inc.

Lockheed Martin Energy Research Corporation

Lockheed Martin Energy Systems, Inc.

Ralph B Dinwiddie

Victor Frederic Rundquist

Roland D Seals

Susan J Babinec

Beth Louise Armstrong

Claus Daniel

Jane Y Howe

David L Wood, Iii

Lonnie Curt Maxey

Adrian Stefan Sabau

Edward Andrew Payzant

Rickey L White

Danny J King

Patrick L Hagans

Nicole S Nembhard

A system and a method for characterizing a dielectric material are provided. The system and method generally include applying an excitation signal to electrodes on opposing sides of the dielectric material to evaluate a property of the dielectric material. The method can further include measuring the capacitive impedance across the dielectric material, and determining a variation in the capacitive impedance with respect to either or both of a time domain and a frequency domain. The measured property can include pore size and surface imperfections. The method can still further include modifying a processing parameter as the dielectric material is formed in response to the detected variations in the capacitive impedance, which can correspond to a non-uniformity in the dielectric material.

Characterization of dielectric materials

A computer executing a software algorithm may be used to detect a depression in a temperature profile. The temperature profile may be smoothed to eliminate noise. Next, the temperature profile's center may be extracted. A polynomial may be fitted to extracted data. An algorithm used to fit the polynomial may guarantee that the fitted curve's peak may be below the actual temperature data's peak. Next, residuals may be calculated by subtracting the fitted curve from the actual data. If there is a dip at the center, then the residuals in the center may be less than zero. The software algorithm executing on the computer may then make a decision based on a sign of the residuals. For example, residuals less than zero may indicate bar porosity. Residuals above zero may indicate no porosity. The magnitude of the residuals may then be used to classify a size of a detected defect.

Porosity detection

An alloy substrate is protected by a thermal barrier coating formed from a layer of metallic bond coat and a top coat formed from generally hollow ceramic particles dispersed in a matrix bonded to the bond coat.

Thermal barrier coating for alloy systems

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Ralph B Dinwiddie