Leica Microsystems Cms Gmbh

Leica Microsystems Wetzlar Gmbh

Hauni Maschinenbau Ag

Ralf Krüger

Christian Schulz

Peter Euteneuer

Jürgen Grossmann

Andreas Schubert

Jörg Schlisio

Katharina Hinz

The present invention relates to an imaging device () for imaging microscopic or macroscopic objects (). The imaging device () comprises a light source (), an illumination beam path (), an imaging beam path () and an imaging optical means (), in particular in the form of an objective. The illumination beam path () extends from the light source () to the object (). The imaging beam path () extends from the object () to a detector or a tube (). At least one polarization means () is provided in the illumination beam path (), which polarization means () can be used to convert the light of the light source to a prescribable polarization state. An analyzer means () is provided in the imaging beam path (), with the analyzer means () and the polarization means () being able to be adjusted in relation to one another in such a manner that the light entering the imaging beam path () cannot pass through the analyzer means (). An adjustable optical component () is provided in the beam path between the polarization means () and the analyzer means () for largely suppressing undesired reflections at optical components () in the beam path of the imaging device (), which optical component can be used to either largely depolarize the polarized light serving for the object illumination or to split it into partial beams, depending on its adjustment.

Imaging device for imaging microscopic or macroscopic objects

The present invention relates to a polarization interference microscope () for imaging objects (). The polarization interference microscope () comprises a light source (), an illumination beam path (), an imaging beam path () and an objective (). The illumination beam path () extends from the light source () to the object (). The imaging beam path () extends from the object () to a detector or a tube (). At least one polarization means () is provided in the illumination beam path () and/or in the imaging beam path (), by which at least one polarization means the light of the respective beam path () can be converted into a predeterminable polarization state. An analyzer means () is provided in the imaging beam path (). A birefringent component is provided between the polarization means () and the analyzer means (), by which birefringent component the light polarized by the polarization means () can be divided into two partial beams () having different polarization directions. The component can produce a splitting between the two partial beams (). The present invention furthermore relates to a retrofit kit for a conventional microscope and for a conventional polarization interference microscope, respectively, and a method for imaging objects. In order to enable variable contrasting of the interference contrast, the polarization interference microscope () according to the invention is characterized by the fact that the component has a liquid crystal element () formed in such a way that the value of the splitting between the two partial beams () is settable in a variable manner thereby.

Polarization interference microscope

The present invention concerns a microscope and an illumination device for a microscope that ensure optimal illumination in the standard (10&#xd7;&#x2013;100&#xd7;), scanning (1.6&#xd7;&#x2013;5&#xd7;), and macro (1&#xd7;&#x2013;1.6&#xd7;) ranges. The illumination system comprises only one condenser head that can be switched in or out and that can optimally illuminate the entire range from 1&#xd7; to 100&#xd7;, and a movably arranged focusing lens that ensures optimal adaptation of the illumination to the entrance pupil for all ranges.

Transmitted-light illumination device for a microscope

Growing community of inventors

Butzbach/Griedel, Germany

Ralf Krüger