Texas Instruments Corporation

Rakesh Channabasappa Yaraduyathinahalli

Prakash Narayanan

Sundarrajan Rangachari

Jasbir Singh

Nikita Naresh

Aravinda Acharya

Desmond Pravin Martin Fernandes

Naveen Ambalametil Narayanan

Prathyusha Teja Inuganti

Saket Jalan

Shekhar Dinkar Patil

A system includes a volatile storage device, a read-only memory (ROM), a memory built-in self-test (BIST) controller and a central processing unit (CPU). The CPU, upon occurrence of a reset event, executes a first instruction from the ROM to cause the CPU to copy a plurality of instructions from a range of addresses in the ROM to the volatile storage device. The CPU also executes a second instruction from the ROM to change a program counter. The CPU further executes the plurality of instructions from the volatile storage device using the program counter. The CPU, when executing the plurality of instructions from the volatile storage device, causes the ROM to enter a test mode and the memory BIST controller to be configured to test the ROM.

Testing read-only memory using memory built-in self-test controller

Disclosed embodiments include a system having a first memory, a second memory, circuitry that reads data quantities from the first memory along a first orientation, a compression engine that compresses each of the read data quantities to produce corresponding compressed data quantities, and circuitry that writes the compressed data quantities to the second memory along a second orientation which differs from the first orientation. The read data quantities have a first bit width and the compressed data quantities have a second bit width that is less than the first bit width.

Memory compression operable for non-contiguous write/read addresses

Disclosed embodiments include a system having a first memory for storing a plurality of data quantities, each data quantity consisting of a first number of bits, and a second memory for storing a plurality of compressed data quantities, each compressed data quantity consisting of a second number of bits that is less than the first number of bits. The system includes circuitry for reading data quantities from the first memory and for writing compressed data quantities, corresponding to respective read data quantities, to non-sequential addresses in the second memory. The circuitry for reading data quantities from the first memory is for reading along a read orientation selected from one of row-orientation or column-orientation from the first memory, and the circuitry for writing compressed data quantities in the second memory is for writing along a write orientation in the second memory that differs from the read orientation.

The present invention is drawn to a register writing mechanism that does not require reading of the data in the register. In accordance with aspects of the present invention, each register is masked with a making bit provided by a masking component. In a first implementation, the first half of the bit registers are masked using data in the second half of the bit registers. In a second implementation, all the bit registers are masked using a masking word generated by the masking component.

System and method for fast modification of register content

The disclosure provides an asynchronous FIFO circuit that includes a data memory which is coupled to a write data path and a read data path. The data memory receives a write clock and a read clock. A FIFO write pointer counter receives a write enable signal and the write clock. The FIFO write pointer counter provides a FIFO write pointer signal to the data memory. A FIFO read pointer counter receives a read enable signal and the read clock. The FIFO read pointer counter provides a FIFO read pointer signal to the data memory. A control circuit receives the write enable signal, the read enable signal, the FIFO write pointer signal, the FIFO read pointer signal, the write clock and the read clock. The control circuit generates a memory full signal when the data memory is full and a memory empty signal when the data memory is empty.

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Bengaluru, India

Rakesh Channabasappa Yaraduyathinahalli