Avago Technologies General IP (singapore) Pte. Ltd.

Arm Limited

Lsi Corporation

Stmicroelectronics International N.v.

Rajiv Kumar Roy

Rahul Sahu

Rasoju Veerabadra Chary

Vikash

Donald Albert Evans

Fakhruddin Ali Bohra

Ashish Kumar

Dharmendra Kumar Rai

Disha Singh

Manish Trivedi

Sahilpreet Singh

Sumant Kumar Thapliyal

Jeffrey Charles Herbert

Manoj Puthan Purayil

Kanika Malik

Various implementations described herein are directed to an integrated circuit. The integrated circuit may include core circuitry having an array of memory cells and a row decoder that accesses each of the memory cells via a selected wordline and a wordline signal. The core circuitry may operate at a first supply voltage. The integrated circuit may include periphery circuitry having a column decoder that accesses each of the memory cells via a selected bitline. The periphery circuitry may operate at a second supply voltage that is different than the first supply voltage. The periphery circuitry may include voltage differential sensing circuitry that may compare the first supply voltage to the second supply voltage, sense a voltage differential between the first and second supply voltages, and delay the wordline signal when the voltage differential is greater than a threshold voltage.

Voltage aware circuitry

Various implementations described herein are directed to an integrated circuit having high density memory architecture. The integrated circuit may include a plurality of bank arrays having multiple segments of bitcells configured to share local control. The integrated circuit may include a plurality of control lines coupling the local control to each of the multiple segments of bitcells. In some instances, during activation of a segment of bitcells by the local control via one of the control lines, another segment of bitcells may be deactivated by the local control via another of the control lines.

High density memory architecture

SRAM devices are disclosed that utilize write assist circuits to improve the logical transitions of bit lines. In one embodiment, an SRAM device includes a pair of complimentary bit lines traversing a memory cell array for writing data to memory cells. The bit lines have a first end and a second end. A pair of complimentary write drivers is proximate to the first end of the bit lines that writes to the bit lines. A write assist circuit is proximate to the second end of the bit lines that receives a pre-charge signal to assist the write drivers in transitioning the bit lines from a logical zero state to a logical one state. The write assist circuit also receives a boost signal to assist the write drivers in transitioning the bit lines from a logical one state to a logical zero state.

Bit line write assist for static random access memory architectures

Single-ended read circuits for SRAM devices are disclosed for high performance sub-micron designs. One embodiment is an SRAM device that includes a memory cell array and a bit line traversing the memory cell array for reading data from memory cells of the memory cell array. A read circuit coupled to the bit line translates data stored in a memory cell from a cell voltage of the memory cells to a peripheral voltage of an output of the SRAM device while bypassing a level shifter in the read data path.

Dual rail single-ended read data paths for static random access memories

A read-only memory (ROM) cell has first and second transistors connected in series between a true bit line and a voltage reference (e.g., ground), and third and fourth transistors connected in series between a complement bit line and the voltage reference. The gates of the first and third transistors are connected to a first word line, and the gates of the second and fourth transistors are connected to a second word line. The ROM cell is programmed to store any possible combination of two bits of information by appropriately (i) connecting the node between the first and second transistors to either the true bit line, the complement bit line, or the voltage reference and (ii) connecting the node between the third and fourth transistors to either the true bit line, the complement bit line, or the voltage reference.

Two-bit read-only memory cell

Word line assist circuits are disclosed for high performance sub-micron SRAM designs. One embodiment is an SRAM device that includes a memory cell array and a pair of word lines that traverse the memory cell array for selecting memory cells. The SRAM device further includes a pair of word line drivers, each coupled to one of the word lines. The SRAM device further includes a word line assist circuit coupled to the pair of word lines that receives an enable signal. Responsive to receiving the enable signal, the word line assist circuit assists the first word line driver and the second word line driver in transitioning their respective word lines from a logic level zero to a logic level one in response to a voltage differential between the word lines.

Differential latch word line assist for SRAM

A Read Only Memory (ROM) and method for providing a high operational speed with reduced leakage, no core cell standby leakage, and low power consumption. The source of the ROM cell (NMOS) is connected to a virtual ground line (VNGD) instead of VSS. Thus, the ROM cell can be operatively coupled to the bit-line, the word-line, and the virtual ground, which also acts as a column select signal. The arrangement of the ROM is such that the virtual ground of the selected column is pulled down to a ground voltage. Non-selected columns virtual ground can be maintained at a supply voltage to ensure that unwanted columns will not have any sub-threshold current (as Vds=0). Since no pre-charging of bit-line comes in the access time path, the ROM achieves a high operational speed with reduced leakage and low power consumption.

Fast access with low leakage and low power technique for read only memory devices

A sense amplifier circuit, a method of modifying a differential voltage in a sense amplifier circuit and a memory system incorporating the sense amplifier circuit or the method are described. The sense amplifier circuit is described to include: (1) a differential amplifier having first and second inputs respectively couplable to first and second complimentary bit lines and configured to receive a differential voltage therefrom representing a current logic value to be read and (2) a sense speed alteration circuit having first and second outputs respectively coupled to the first and second inputs via respective first and second capacitors and configured to cause one of the first and second capacitors to discharge to increase the differential voltage when a previously read logic value is opposite the current logic value to be read.

Circuit and method for improving sense amplifier reaction time in memory read operations

A circuit and method for dynamically changing trip point voltage in a sensing inverter circuit. In one embodiment, the sensing inverter circuit includes: (1) a base inverter circuit couplable to logic-high and logic-low voltage sources at respective inputs thereof and configured to transition an output thereof from a previous logic-level voltage to a present logic-level voltage based on a logic value of an input voltage received by the base inverter circuit, and (2) a feedback circuit associated with the base inverter circuit and configured to employ the previous logic-level voltage to decouple one of the logic-high and logic-low voltage sources from one of the inputs and thereby shift a trip voltage of the base inverter circuit toward the input voltage.

Circuit and method for dynamically changing a trip point in a sensing inverter

A decoder circuit to decode an address for accessing a memory cell in a memory array includes address latch circuitry, inverter circuitry, and first address pre-decode circuitry. The address latch circuitry receives an address signal and generates address holding signals during a setup period. The address latch circuitry latches the address holding signals during an address hold period following the setup period. The inverter circuitry receives the address signal and generates a complementary address signal. The first address pre-decode circuitry decodes the address signal and the address holding signals during the setup period to generate a first pre-decode address signal at an output of the first address pre-decode circuitry. In addition, the first address pre-decode circuitry decodes the address holding signals during the address hold period to maintain the first pre-decode address signal at the output of the first address pre-decode circuitry.

Address decoding circuits for reducing address and memory enable setup time

A system is capable of assisting in reset of a data storage array including data storage array including one or more data storage array nodes. The system includes a control unit coupled to the data storage array configured to produce a control signal to reset the data storage array, and a reset unit communicatively coupled to the data storage array and the control unit configured to reset the data storage array by charge injection to the one or more data storage array nodes.

Growing community of inventors

Bengaluru, India

Rajiv Kumar Roy