Oracle International Corporation

Rajiv K Maheshwari

Richard Sarwal

Ashwin Kumar Karkala

Sandeep Pandita

Lalatendu Patra

Mridhula N Shetty

Venkata Ramana Kapuram

Techniques for running diagnostic rules across multiple nodes are disclosed. A root cause of an error occurring on a particular node is determined. A root cause of an error on the particular node is identified based on a metric corresponding to another node and/or based on a previously-reported error on another node. Additionally or alternatively, an error is predicted to occur on a particular node. The error is predicted based on a trend associated with a metric corresponding to another node.

Mechanism for running diagnostic rules across multiple nodes

Techniques for improved metric correlation and analysis include, during a modeling phase, a user familiar with the types of system components deployed in an enterprise network and the metrics available for those types of system components specifying dependencies between metrics in a metric dependency model. During a binding phase, the metric dependency model is provided to a modified enterprise management (MEM) system which binds the model to particular enterprise system environment. During a metric correlation and analysis phase, the MEM system provides a user-interface through which a user visually compares metric data for metrics collected from system components deployed in an enterprise system environment bound to the model. The improved metric correlation analysis techniques allow users to more easily identify whether degradation in the performance of one metric is caused by performance degradation of underlying information technology system components as measured by related metrics specified in the metric dependency model.

Metric correlation and analysis

Growing community of inventors

Saratoga, CA, United States of America

Rajiv K Maheshwari