Xilinx, Inc.

Rajesh Bansal

Riyas Noorudeen Remla

Siddharth Rele

Bradley K Fross

Heera Nand

Mahesh Sankroj

Niloy Roy

Approaches for capturing states of signals of a circuit-under-test are disclosed. A logic analyzer circuit is coupled to the circuit-under-test and is configured to receive a plurality of probe signals and a plurality of trigger signals from the circuit-under-test. The logic analyzer circuit inputs data identifying a subset of the probe signals and a subset of the trigger signals. The logic analyzer circuit selects the subset of trigger signals for input to trigger logic and selects the subset of probe signals in the logic analyzer circuit after the logic analyzer circuit and the circuit-under-test are active. The logic analyzer circuit samples states of the subset of probe signals in response to the trigger logic and stores the sampled states of the subset of probe signals in a memory.

Configurable system and method for debugging a circuit

Circuits and methods for capturing internal signal values in a circuit before, during, and after a trigger event are disclosed. For example, a circuit can include a shift register configured to receive data values of an input data set over a plurality of cycles, and a counter unit configured to receive a trigger signal and to output the trigger signal after a number of cycles following the receiving of the trigger signal, where the trigger signal indicates a trigger event. The circuit can also include a switch configured to receive the trigger signal from the counter unit and to open a connection between an input interface and the shift register in response to receiving the trigger signal.

Built-in integrated circuit debug design

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Singapore, Singapore

Rajesh Bansal