Xerox Corporation

Raj Minhas

D Rene Rasmussen

Meera Sampath

Eric Jackson

Ronald M Rockwell

Ashok V Godambe

Using a system of computer modules operatively associated with a document processing machine, banding defect analysis is accomplished by analyzing specific test patterns via image processing. The banding defects are characterized in terms of quantitative parameters based on an analysis of the banding defect. Key features are extracted from the banding defect parameters. The key features are analyzed in a diagnostic engine, to determine the possible source of the defect. The identified source is correlated to a recommended repair service procedure. The diagnostic process may be augmented by also including machine data in the analysis.

Growing community of inventors

Webster, NY, United States of America

Raj Minhas