Bruker Axs Analytical X-ray Systems Gmbh

Bruker Axs Gmbh

Rainer Golenhofen

Volker Lehmann

An X-ray multichannel spectrometer comprising a polychromatic source (), a holding means () for holding a sample (), a fluorescence channel () that selects X-ray beams of a special wavelength and energy, and a detector () for measuring the selected X-ray beams, a diffractometry channel () that selects, by means of a monochromator (), an X-ray beam wavelength of the source subsequent to diffraction of the X-ray beams by the sample, and a detector () for measuring the selected X-ray beams, is characterized in that a single slit device () is provided between the source and the sample, which can be moved transversely with respect to the direction of the beam from the source, and the monochromator of the diffractometry channel is stationarily disposed with respect to the source and the sample and has an entry single slit () which defines, together with the movable single slit device and the sample position, the characteristic diffraction angle 2&#x3b8; of a predetermined crystal structure of the polycrystalline sample at the wavelength of the source selected by the monochromator. In this fashion, reliable element analysis and inexpensive X-ray diffraction can be performed with the same device, wherein the at least three collimator arrangements that have been necessary up to now for the diffractometry channel, are omitted and the monochromator does not require any complex diffraction mechanism in the diffractometry channel.

X-ray multichannel spectrometer

An X-ray analysis device ( ) having an X-ray source ( ) for illuminating a sample ( ) with X-radiation ( ), a sample support for receiving the sample ( ) and a detector ( ) for detecting the diffracted or scattered X-radiation or fluorescent X-radiation ( &prime;) emitted by the sample, wherein an X-ray optical construction element of semi-conductor material having a plurality of channels which are essentially transparent to X-radiation ( &prime;) is provided in the path of rays between the X-ray source ( ) and the detector ( ), is characterized in that the X-ray optical construction element comprises a semi-conductor wafer ( ) into which micropores ( ) are etched which extend essentially in parallel in the direction of the rays and have diameters of 0.1 to 100 &mgr;m, preferably 0.5 and 20 &mgr;m. Such X-ray optical construction elements are, on the one hand, not poisonous, and on the other hand particularly transparent for X-rays, wherein a relatively high mechanical rigidity can be achieved also with large openings and very short construction lengths and thus also a particularly long service life and high pressure stability and density.

X-ray analysis device with X-ray optical semi-conductor construction element

An X-ray fluorescence spectrometer (,) for the analysis of a solid or liquid sample (,) arranged in a measuring position on a sample holder (,) in a compact sample chamber (,), the sample having a maximum linear extension of 1 dm, with an X-ray tube (,) projecting into the sample chamber for irradiating the sample and with a detector (,) being arranged in a detector chamber (,), wherein the detector chamber can be separated in a vacuum-tight manner from the sample chamber by means of a closing element (,), is characterized in that the sample chamber comprises a moveable wall element (,) which, in an &ldquo;open&rdquo; state, permits direct access to the sample (,) in its measuring position in the sample chamber (,) and, in a &ldquo;closed&rdquo; state, seals the sample chamber (,) with respect to the surrounding atmosphere. In this manner, the spectrometer is more compact and fabrication is considerably easier, charging of the sample chamber with a test sample is less demanding, gas exchange between the respective chambers is simplified, the operational safety of the device, in particular during the sample changing phase, is increased and maintenance and repair works of the sample chamber itself are facilitated.

Compact X-ray spectrometer

A spectrometer for the simultaneous measurement of several spectral lines from a sample (,) with several wavelength selectors (,) which supply light of a certain wavelength selectively to a detector (9), wherein each wavelength selector selects a different wavelength, is characterized in that at least two different wavelength selectors (,) can supply light from the sample (,) to the same detector (,) and that the detector (,) is energy-dispersive and has sufficiently large resolution in order to energy separate the detected light of the various wavelengths from the at least two different wavelength selectors. In this manner it is possible on the one hand to achieve the high resolution of known wavelength-dispersive arrangements with relatively short measuring times due to simultaneous measurements of different wavelength ranges and on the other hand the number of detectors and associated measurement electronics is considerably reduced without requiring in turn a considerably higher effort on the mechanical side of the apparatus.

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Ettlingen, Germany

Rainer Golenhofen