Siemens Aktiengesellschaft

Festo Ag & Co

Rainer Duebel

Stefan Burger

A method and device are for monitoring electric components in a pick-and-place device for substrates. The underside of a pick-up is monitored by an optical scanner during the pick-up phase and during the placing phase of a component. A lift drive for the pick-up is provided with a position sensor that is linked with a control device. The scanner emits and receives a scanning beam oriented transversally to the direction of lift and is likewise coupled with the control device, thereby allowing monitoring of the underside of the pick-up in a direct time-related manner with the picking and placing of the component. The various lift positions are saved and compared when a threshold value of the received scanning beam is exceeded so that the inventive device also allows for a monitoring of the height of the component.

Method and device for monitoring electric components in a pick-and-place device for substrates

Substrates are supported by height-adjustable supporting pins in automated equipping units. The supporting pins are composed of a tip and a foot part that is spring-borne relative to the tip. When the supporting pins are placed against an underside of the substrate, the supporting pins individually adapt to the contour of the underside of the substrate. The height position of the supporting pins is subsequently fixed. As a result, substrates having position and surface variations can be protected against sagging upon placement of components on the substrates during an automated equipping process.

Supporting pin for supporting substrates in automatic equipment units

A pressure control means comprising a jet pump ( ) whose pressure state in a branch flow duct ( ) may be changed by means of a choke ( ), which influences the spent air flow from the jet pump ( ). This renders possible a rapid and stepless variation of the pressure state in the branch flow duct ( ).

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Baldham, Germany

Rainer Duebel