Universiteit Maastricht

Raimond Ravelli

Jacobus Peter Johannes Peters

Paul Van Schayck

Iglesias Carmen Lopez

Franciscus Johannes Theresia Nijpels

Jacobus Peter Johannes Peter

Pascal Paul Marie Huysmans

Rene Jacobus Maria Henderikx

Carmen LÓPEZ-Iglesias

Bart Wilhelmus Anna Maria Mathis Beulen

Sanne Thewessem

Carmen López Iglesias

Iglesias Carmen LÓPEZ

The invention relates to a method of and apparatus for preparing a sample for imaging or diffraction experiments under cryogenic conditions, comprising the steps of applying a sample to sample carrier, such as a film on a support, in particular a grid comprising such a film on a support, or removing residual medium, typically liquid, from an incubated sample on a film on a support, and vitrifying the sample. The sample is vitrified by directing a jet of liquid coolant to the center of the film and onto the sample.

Method of and apparatus for preparing samples for imaging or diffraction experiments under cryogenic conditions

A sample may be inspected by making particles traverse the sample. The particles that have traversed the sample hit a detector one-by-one. In response thereto, the detector provides a sequence of respective detection outputs. The sequence of respective detection outputs is processed so as to identify respective locations where respective incident particles have hit the detector. An image is generated on the basis of the respective locations that have been identified. In order to determine a location where an incident particle has hit the detector, an evaluation is made with regard to pre-established respective associations between, on the one hand, respective locations where incident particles have hit the detector and, on the other hand, respective detection outputs.

Sample inspection method and system

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Maastricht, Netherlands

Raimond Ravelli