General Electric Company

Rai Mohan Dasarathan

Anandamurugan S

Jerome Poirier

Michael Maria Berke

Chad Martin Shaffer

Peter Renzel

Douglas Paul Lutz

A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.

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Bengaluru, India

Rai Mohan Dasarathan