International Business Machines Corporation

Rahul Sharad Moharil

Shakti Kapoor

Manoj Dusanapudi

Sunil Suresh Hatti

Shubhodeep Roy Choudhury

Vinod Bussa

Bhavani Shringari Nanjundiah

Sandip Bag

A system and method for intentionally invaliding translation entry valid bits in order to provoke storage interrupts when executing a test case is presented. Prior to executing the test case, an interrupt handler pseudo-randomly invalidates a number of translation entries included in a translation lookaside buffer (TLB) by changing particular valid bits in order to provoke initial storage interrupts, such as an instruction storage interrupt (ISI) or a data storage interrupt (DSI). Once the processor executes the test case that, in turn, triggers a storage interrupt, the interrupt handler uses an index counter to validate particular valid bits and invalidate other valid bits, thus provoking subsequent storage interrupts. In one embodiment, the interrupt handler also changes valid bits in a page table when the processor executes in a mode that accesses the page table in addition to the TLB.

System and method for generating fast instruction and data interrupts for processor design verification and validation

A system and method for using resource pools and instruction pools for processor design verification and validation is presented. A test case generator organizes processor resources into resource pools using a resource pool mask. Next, the test case generator separates instructions into instruction pools based upon the resources that each instruction requires. The test case generator then creates a test case using one or more sub test cases by assigning a resource pool to each sub test case, identifying instruction pools that correspond the assigned test case, and building each sub test case using instructions included in the identified instruction pools.

System and method for using resource pools and instruction pools for processor design verification and validation

A system and method to reduce verification time by sharing memory between multiple test patterns and performing results checking after each test pattern executes one time is presented. A test pattern generator generates multiple test pattern sets, each of which including multiple test patterns. Each test pattern set is executed by a corresponding thread/processor until each test pattern included in the test pattern set has executed at least once. After all test patterns have executed at least once, a test pattern executor performs a memory error detection check to determine whether the system is functioning correctly. Since the invention described herein waits until all test patterns have executed before performing a memory error detection check, less time is spent on memory error detection checks, which allows more time to execute test patterns.

System and method for increasing error checking performance by calculating CRC calculations after multiple test patterns for processor design verification and validation

A system and method processor testing using test pattern re-execution is presented. A processor re-executes test patterns using different timing scenarios in order to reduce test pattern build time and increase system test coverage. The invention described herein varies initial states of a processor's memory (cache, TLB, SLB, etc.) that, in turn, varies the timing scenarios when re-executing test patterns. By re-executing the test patterns instead of rebuilding new test patterns, verification quality is improved since more time is available for execution, verification and validation. In addition, since the test patterns result in the same final state, the invention described herein also simplifies error checking.

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Maharashtra, India

Rahul Sharad Moharil