Ampere Computing LLC

Rahul Nadkarni

Babji Vallabhaneni

Yeshwant Kolla

David Hoff

Virtualized scan chain testing in a random access memory array, and related methods and computer-readable media are disclosed. To facilitate virtualized scan chain testing, the memory array includes an integrated test circuit that causes the memory array to behave as a serialized scan chain. The integrated test circuit forces serialized write and read access to offset entries in the memory array on each scan cycle in a scan mode based on received serialized test data. After the number of scan cycles equals the number of entries the memory array, the entries in the memory array are fully initialized with test data from the serial test data flow. In subsequent scan cycles, the integrated test circuit continues to perform serial read operations to cause stored serial test data to be serially shifted out as an output serial data flow that then be compared to the original serial test data.

Virtualized scan chain testing in a random access memory (RAM) array

A memory with data array (e.g., L2 cache) addressable in rows and columns and techniques to access data therein are proposed. Unlike conventional data arrays, the proposed memory allows data access to be initiated based on a row (or set) address even though the column (or way) address is not yet available. When the column address is determined, it can be used to select the correct data. Since the data access is started prior to determining the column address, memory access latency is reduced.

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Cary, NC, United States of America

Rahul Nadkarni