Leica Microsystems Cms Gmbh

Leica Microsystems Heidelberg Gmbh

Rafael Storz

Holger Birk

Johann Engelhardt

Volker Seyfried

Kyra Moellmann

Werner Knebel

Heinrich Ulrich

Juergen Hoffmann

Joachim Bradl

William C Hay

Joerg Bewersdorf

Martin Hoppe

Nicole Hartmann

A method for superimposing optical information in a scanning microscope includes determining a transformation matrix, and superimposing first optical information of a CCD image and second optical information of at least one piece of second image information using the transformation matrix.

Method for superimposing optical information in a scanning microscope

A device for generating a laser light beam includes a module. The module includes at least one laser light source, and a mechanical, an electrical and/or an optical interface defined towards an outside of the module.

Device for generating a laser light beam

The arrangement for examining microscope preparations with a scanning microscope comprises a laser () and an optical means () which images the light generated by the laser () onto a specimen () that is to be examined. Provided between the laser () and the optical means () is an optical component () that spectrally spreads, with a single pass, the light generated by the laser (). The optical component () is made of photonic band-gap material. It is particularly advantageous if the photonic band-gap material is configured as a light-guiding fiber ().

Broadband laser illumination device for a scanning microscope with output stabilization

A method for separating detection channels is disclosed, a sample () being equipped with at least two different fluorescent dyes. Firstly the emission spectrum of at least two fluorescent dyes is ascertained. From the emission spectra, the separation points of the wavelength and of the individual detection channels are determined. Lastly, adjustment of the separation of the at least two channels is accomplished on that basis.

Method for separating detection channels of a microscope system

An apparatus for mounting for multiple lasers () is disclosed. The multiple lasers () generate light that is guided via a light-guiding fiber to an optical system (). Provided for that purpose on the mounting plate () is a combining unit () that comprises multiple input ports (). Each of the lasers () possesses an output () for its light, each laser () being mounted on the mounting plate () in such a way that the respective output () is colinear with the respective pertinent input port () of the combining unit (). The combining unit () combines the light of the multiple lasers () into a single beam ().

Apparatus for mounting multiple lasers, and microscope

A scanning microscope, having a detector, arranged in a detection beam path, for receiving detection light proceeding from a sample, has between the sample and the detector an optical shutter means with which the detection beam path can be blocked. A control means for controlling the shutter means is provided. The detection light beam path can be blocked automatically outside the scanning operation and in the event of an excessive detection light power level.

Scanning microscope

A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.

Scanning microscope comprising a confocal slit scanner for imaging an object

A microscope includes an adjustment device for positioning a specimen stage. An objective, an objective changer and/or an objective turret is coupled to the adjustment device so that a position of the objective element is adjustable by the adjustment device. A holder for the objective element may be provided coupling the objective element to the adjustment device.

Microscope

An apparatus for detecting photons of a light beam emanating from a spatially limited source includes a detection device having a plurality of detectors forming a three-dimensional array with semitranslucent EMCCDs disposed one behind another. A light splitting device is disposed in a path of rays of the light beam for splitting the light beam so as to distribute the photons over the detectors for detection.

Apparatus for the detection of photons of a light beam having a three-dimensional array of detectors

The present invention concerns a method for setting the system parameters of a scanning microscope, preferably a confocal scanning microscope, acquisition of an image of the specimen performed with the scanning microscope being controlled by a control computer. After an image of the specimen is acquired at least one image quality feature is inputted by a user and is converted by the control computer into at least one system parameter of the scanning microscope.

Method for setting the system parameters of a scanning microscope

A device for selectively detecting specific wavelength components of a light beam includes a spectral spreading element for spectrally spreading the light beam, and a detector array arranged downstream of the element. The detector array includes light-insensitive regions and light-sensitive regions. The element and the detector array are matched to each other so that selectable wavelength components of the light beam hit the light-insensitive regions and remaining wavelength components of the light beam hit the light-sensitive regions.

Device for selectively detecting specific wavelength components of a light beam

A method for classifying a plurality of object image regions of an object to be detected using a scanning microscope includes labeling each of the image areas of the object with a different marker so that light of a respective characteristic emanates from each marker. The intensity of the light from each marker is detected using at least two channels so as to generate detection signals, each detection signal being a function of the intensity of the detected light. The object regions are classified using ratios of the detection signals.

Method for classifying object image regions of an object to be detected using a scanning microscope

A detector, arranged in the detection beam path of a scanning microscope, for the detection of detected light proceeding from a sample can be used to detect other than the detected light for example of external optical experiments. The scanning microscope comprises an incoupling apparatus with which light other than the detected light can be coupled into the detection beam path and conveyed to the detector.

In a method for scanning microscopy an illuminating light beam that contains at least first light of a first wavelength and second light of a second wavelength, is coded. The coded illuminating light beam is directed onto a specimen and detection light proceeding from the specimen is decoded.

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Heidelberg, Germany

Rafael Storz