General Electric Company

Applied Materials, Inc.

Morpho Detection, Inc.

Rachit Sharma

Chayan Mitra

Sandip Maity

Vinayak Tilak

Eric YuHang Fung

Anish Bekal

Narendra Digamber Joshi

Mehdi Vaez-Iravani

Guoheng Zhao

Rahul Jaikaran Chillar

Julio Enrique Mestroni

Gordon Raymond Smith

Anthony Kowal

Sameer Dinkar Vartak

David Kelly Moyeda

Samhitha Palanganda Poonacha

Kunal Ravindra Goray

Venkatarao Ryali

Chong Tao

Xiaoyong Liu

Steven Keith Handelsman

Nasir Ahmed Desai

Kiran Kumar Bogineni

Sankesha Bhoyar

Arun Kumar Sridharan

Jayeshkumar Jayanarayan Barve

Frank Klaus Ennenbach

Sampa Ghosh

Gordon Smith

Examples disclosed herein generally relate to an apparatus and method for detecting particles in a fluid. A system for imaging a particle includes an imaging device. The imaging device has a lens and a detector. A laser source is configured to emit a laser beam. The detector is configured to accumulate an intensity of an accumulated light that passes through the lens. The accumulated light is scattered by the particle. The particle passes through the laser beam over a given period.

In-situ, real-time detection of particulate defects in a fluid

A method () for desulfurization of a flue gas in a desulfurization unit of an industrial plant, includes receiving () a plurality of baseline parameters corresponding to the desulfurization unit of the industrial plant. The method further includes measuring (), using a stack sensor, an emission value of sulfur oxides in the flue gas. The method also includes estimating (), using a controller, a desirable value of a slurry parameter for desulfurization of the flue gas based on the measured emission value of the sulfur oxides. The method further includes determining (), using the controller, at least one desulfurization parameter based on the desirable value of the slurry parameter. The method also includes controlling (), using the controller, operation of the desulfurization unit based on the at least one desulfurization parameter to modify consumption of at least one of a slurry and an auxiliary power in the industrial plant.

System and method for optimized operation of flue gas desulfurization unit

One or more light sources emit light within first, second, and third wavelength ranges through exhaust gas. The first and second wavelength ranges are characterized by first and second different absorption wavelength ranges of a background gas. The third wavelength range is characterized by an absorption wavelength range of a gas-of-interest. At least some of the light within the first, second, and third wavelength ranges is absorbed by the exhaust gas thereby providing modified light characterized by the first, second, and third absorption wavelength ranges. One or more detectors receive the modified light. A processing subsystem determines a temperature of the exhaust gas based on the modified light characterized by the first and second absorption wavelength ranges and a concentration of the gas-of-interest based on the modified light characterized by the third absorption wavelength range and the temperature of the exhaust gas.

Gas detector and method of detection

A method for determining a multi-dimensional profile of at least one emission parameter corresponding to an exhaust emission of a combustion process is presented. The method includes emitting a laser beam in a plurality of directions through the exhaust emission. The laser beam includes a plurality of wavelengths and the exhaust emission is characterized by the plurality of emission parameters. The method further includes detecting a plurality of absorption spectrum signals for each of the plurality of directions and determining a plurality of single-dimensional profiles corresponding to the at least one emission parameter. Each of the plurality of single-dimensional profiles is determined based on the plurality of absorption spectrum signals corresponding to each respective direction of the plurality of directions. The method also includes generating the multi-dimensional profile corresponding to the at least one emission parameter based on the plurality of single-dimensional profiles.

System and method for determining an exhaust emission parameter profile

A system is presented. The system includes an electromagnetic radiation source configured to generate a mode matched electromagnetic radiation that irradiates a gas mixture filled in a gas compartment at a determined pressure 'P' bars, an intensity enhancement mechanism that internally reflects the mode-matched electromagnetic radiation a plurality of times to achieve an effective intensity 'E', of reflected electromagnetic radiation in a region of interest, that is &#x2018;N&#x2019; times an intensity of the mode-matched electromagnetic radiation, and a detection subsystem that analyses the gas-mixture based upon Raman Scattered photons emitted from the region of interest, wherein a product of the &#x2018;P&#x2019; and the &#x2018;N&#x2019; is at least 30.

Methods and systems to analyze a gas-mixture

A system is presented. The system includes an electromagnetic radiation source configured to generate a mode-matched electromagnetic radiation that irradiates a gas-mixture filled in a gas compartment at a determined pressure 'P' bars, an intensity enhancement mechanism that internally reflects the mode-matched electromagnetic radiation a plurality of times to achieve an effective intensity 'E', of reflected electromagnetic radiation in a region of interest, that is &#x2018;N&#x2019; times an intensity of the mode-matched electromagnetic radiation, and a detection subsystem that analyzes the gas-mixture based upon Raman scattered photons emitted from the region of interest, wherein a product of the &#x2018;P&#x2019; and the &#x2018;N&#x2019; is at least 30.

A method for correcting frequency offset in a dual comb spectroscopy system is provided. The method includes causing a first laser (L1) generator to transmit L1 pulses at a repetition rate of a first frequency and causing a second laser (L2) generator to transmit L2 pulses at a repetition rate of a second frequency. The method also includes interrogating a reference material using a combination of the L1 pulses and the L2 pulses and capturing reference cell pulses. The method further includes interrogating a material of interest using the L1 pulses and capturing material of interest pulses. The method includes determining a frequency jitter based on the captured reference cell pulses and the combination of the captured material of interest pulses and the L2 pulses.

Systems and methods for correction of frequency spectrum in dual comb spectroscopy

A method includes receiving a gas mixture at a first pressure including at least a primary gas and a secondary gas and changing a pressure of the received gas mixture from the first pressure to a second pressure. Further, the method includes determining a spectra of the gas mixture at the second pressure, wherein at least the first spectral line of the primary gas is spectrally distinguished from at least the second spectral line of the secondary gas, identifying a peak wavelength associated with the spectrally distinguished first spectral line of the primary gas based on at least two wavelengths of the secondary gas corresponding to at least two peak amplitudes in the spectra of the gas mixture, and determining a concentration of the primary gas based on the identified peak wavelength associated with the spectrally distinguished first spectral line of the primary gas.

System and method for measuring concentration of a trace gas in a gas mixture

A gas detector and method are presented. The gas detector includes a launcher unit for coupling and merging light beams in mid-infrared and infrared wavelength ranges into a single light beam and directing the merged single light beam towards a gas flow path; a receiver unit for generating at least one photo detector current signal based on the light beam transmitted through the gas flow path; and a control unit for processing at least one photo detector current signal to measure concentration of the at least two gases present in the gas flow path.

The present application provides an inlet air fogging system for a gas turbine engine. The inlet air fogging system may include a fogging nozzle array and a fogging control system in communication with the fogging nozzle array. The fogging control system may include a droplet size measurement system and a humidity level measurement system.

Systems and methods for inlet fogging control

An optical displacement sensor is provided according to one embodiment. The optical displacement sensor comprises a housing; a displacement member coupled to the housing, configured to contact an object under test and move based on displacement of the object under test; a light emitter coupled to the housing; an optical transducer coupled to the housing; and a reflecting surface coupled to the displacement member to reflect at least a part of the light emitted from the light emitter to the optical transducer, such that movement of the displacement member modifies intensity distribution of the light reflected to the optical transducer.

Optical displacement sensor and apparatus for measuring displacement

An auto-aligning system is presented. One embodiment of the auto-aligning system includes a launcher unit configured to direct a first laser beam and a second laser beam through a chamber, wherein the first laser beam is co-linear with the second laser beam. The auto-aligning spectroscopy system further includes a receiver unit configured to receive the first laser beam and the second laser beam passing through the chamber. The receiver unit includes a first detector configured to determine an intensity of the first laser beam. The receiver unit also includes a second detector configured to determine a deviation of the second laser beam from a determined position. Further, the auto-aligning spectroscopy system includes a motorized stage configured to align the launcher unit to a base-line position based on the determined deviation of the second laser beam.

Growing community of inventors

Bengaluru, India

Rachit Sharma