Nxp B.v.

Rachid Amine

Jose De Jesus Pineda De Gyvez

Alexander Guido Gronthoud

A method and apparatus for testing analogue or RF circuitry, wherein the power supply VDD is ramped up (step) and quiescent current measurements are taken at selected values of VDD (step) to generate a current signature (step). When the power supply is ramped up, all transistors in the circuit pass through several regions of operation, e.g. subthreshold (region A), linear (region B), and saturation (region C). The advantage of transition from region to region is that defects can be detected with distinct accuracy in each of the operating regions. Once the current signature has been generated it can be compared with the current signature of a fault-free device (step), to determine (step) if the device is operating correctly, and if not, it is discarded.

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Béni-Mellal, Morocco

Rachid Amine