Zhongpai S&t (shenzhen) Co., Ltd

Dongguan Songshan Lake Southern Medical University Sci. & Tech. Park Co., Ltd.

Qiyu Peng

Zhixiang Zhao

Jianfeng Xu

Qiu Huang

Zheng Gong

Siwei Xie

Rendong Zhang

Han Shi

Jingwu Yang

An apparatus for measuring photon information and a photon measurement device are disclosed. The apparatus comprises a signal conversion module for converting an initial signal outputted by the photoelectric sensor into a converted signal in a voltage form, an integral comparison module for integrating a difference between the initial signal and a feedback signal from the negative feedback module and generating a comparison signal based on a magnitude relationship between a reference level and a combination result of an integral signal and the converted signal, wherein the integral signal is a signal for representing an integral of the difference between the initial signal and the feedback signal, a transmission control module for controlling the comparison signal to be transmit based on a clock signal to output a digital signal, a negative feedback module for converting the digital signal into the feedback signal and feeding the feedback signal back to the integral comparison module, and a measurement module for determining, based on the comparison signal and/or the digital signal, an arrival time of a high-energy photon detected by the photoelectric sensor. The apparatus and the device require few circuit components, and can realize high-precision time measurement.

Apparatus for measuring photon information and photon measurement device

An apparatus, device and method for measuring a breakdown voltage are disclosed. The apparatus comprises a controlled voltage source (122), a current detection circuit (124), and a processing circuit (126). The controlled voltage source (122) is used for providing a series of test bias voltages for the sensor unit (110). The current detection circuit (124) is used for detecting a current signal output by the sensor unit (110) and generating a corresponding detection signal. The processing circuit (126) is used for controlling the controlled voltage source (122) to provide a series of test bias voltages, calculating dark currents respectively corresponding to the series of test bias voltages on the basis of the detection signal, and determining a breakdown voltage of the sensor unit (110) on the basis of the series of test bias voltages and the dark currents.

Apparatus, device and method for measuring breakdown voltage

An apparatus, device and method for measuring a gain of a sensor are disclosed. The apparatus comprises a current detection circuit () and a processing circuit (). An input end of the current detection circuit () is used for connecting to an output end of a sensor unit (). The current detection circuit () is used for detecting a current signal output by the sensor unit and generating a corresponding detection signal. An input end of the processing circuit () is connected to an output end of the current detection circuit (). The processing circuit () is used for calculating energy of dark events occurring in the sensor unit () according to the detection signal, generating an energy spectrogram of the dark event, and calculating a gain of the sensor unit () based on the energy spectrogram.

Apparatus, device and method for measuring gain of sensor

A support unit (), a support device () and an emission tomography device using the support device () are provided. The support unit () comprises: a support body (), in which an accommodation space () that penetrates through the support body is provided, comprising multiple support positions (A,B) that are distributed along a circumferential direction of the accommodation space (); and multiple fastening means (A,B), connected to at least some of the multiple support positions. At least some of the multiple fastening means (A,B) can move between a contraction position and an extension position along a radial direction of the accommodation space (). The fastening means (A,B) are used to fasten detectors of the emission tomography device. When the fastening means (A,B) are located at the contraction position, a first detector fastening ring of a first diameter is formed, and when the fastening means (A,B) are located at the extension position, a second detector fastening ring of a second diameter that is smaller than the first diameter is formed. The emission tomography device using the support unit () can adjust at least a radial length of a detection chamber, so that a relatively large three-dimensional space angle can be obtained, thereby improving detection sensitivity.

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Wuhan, China

Qiyu Peng