Centre National De La Recherche Scientifique

Commscope Technologies LLC

Electricite De France

Ecole Normale Superieure De Cachan

Centre National De La Recherche Scientifique-cnrs

Ecole Normale Superieure De Paris-saclay

Qiwei Shi

Walter Mark Hendrix

Charles John Mann

Stéphane Roux

Tri H Nguyen

François Hild

Jiayong Wang

Félix Latourte

The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is characterised in that, in a calculator, during a first step (E, E), a current elastic deformation gradient tensor Fis given a value determined by calculation, during a second step (E), the current displacement field induced by the tensor Fis calculated, during a third step (E), third digital values of a deformed image {hacek over (g)}(x)=g(x+u(x)) corrected by the current displacement field are calculated, and during an iterative algorithm, iterations of the second and third steps (E, E, E) are carried out on modified values of the tensor r Funtil a convergence criterion is met in relation to the correction to the current value of F.

Method, device and program for processing diffraction images of a crystalline material

A modular electronics enclosure includes a rear frame, a first L-shaped piece and a second L-shaped piece joined to form a box-shaped shell having a floor, a ceiling, a rear wall and first and second opposed side walls that define an internal cavity. The first L-shaped piece includes a wall panel and a top panel that form the ceiling and the first side wall of the shell. The second L-shaped piece includes a wall panel and a bottom panel that form the floor and the second side wall of the shell. The rear frame forms the rear wall of the shell.

Outdoor electronics enclosure with modular structure

Growing community of inventors

Shanghai, China

Qiwei Shi