Lattice Semiconductor Corporation

Qin Wei

Chan-Chi Jason Cheng

Ting Yew

Brad Sharpe-Geisler

Vinh Ho

Magathi Jayaram

Hamid Ghezel

In one embodiment, an integrated circuit has one or more multi-channel transmitters, each transmitter having synchronization circuitry that synchronizes different copies of a reset signal used to reset different sets of TX channel circuitry used to generate the multiple TX signals, to reduce the skew between the different TX signals. Each set of synchronization circuitry has (at least) two synchronization stages that re-time different copies of the reset signal to a selected clock signal. In one implementation, the integrated circuit has (at least) two quads, each of which can generate four different TX signals, where both quads can be configured to use the same clock signal to re-time different copies of the reset signal such that the eight different TX signals are all synchronized to one another.

Multi-channel transmitter synchronization circuitry

In one embodiment, a programmable logic device (PLD) with configuration memory includes at least one configuration memory cell and soft error detection (SED) logic for checking for errors in data stored by the configuration memory. The SED logic calculates a present data value for the configuration memory for comparison with a pre-calculated data value. A fuse within the PLD is configurable in a first logic state to enable the SED logic to read from the configuration memory cell in calculating the present data value and configurable in a second logic state to prevent the SED logic from reading from the configuration memory cell in calculating the present data value. The SED logic may be tested for correct operation by writing data representing a soft error into the configuration memory cell and enabling the SED logic to read from the configuration memory cell in calculating the present data value.

Testing of soft error detection logic for programmable logic devices

A programmable logic device, in accordance with one embodiment, includes a plurality of configuration memory cells, wherein at least one configuration memory cell is adapted to function as random access memory. Read/write circuitry writes to and reads from a corresponding first port of the configuration memory cells, including reading from the at least one configuration memory cell adapted to function as random access memory. Soft error detection logic checks for an error in data values stored by the plurality of configuration memory cells, including the at least one configuration memory cell adapted to function as random access memory. The soft error detection logic, for example, may thus be tested by changing a data value stored in the at least one configuration memory cell.

Soft error detection logic testing systems and methods

Systems and methods are disclosed herein to provide high fan-out signal routing. For example, in accordance with an embodiment of the present invention, a programmable logic device includes a plurality of logic blocks; an interconnect structure adapted to route signals among the logic blocks; and a secondary routing network adapted to route signals among the logic blocks. The secondary routing network may include a plurality of horizontal splines adapted to route signals within the programmable logic device; a plurality of vertical spline taps adapted to route signals within the programmable logic device; a plurality of common interface blocks adapted to route signals between the horizontal splines and the vertical spline taps; and a plurality of horizontal secondary branches adapted to route signals from the vertical spline taps to the logic blocks.

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San Jose, CA, United States of America

Qin Wei