Advanced Micro Devices Corporation

Qimeng Derek Zhou

Colin Stewart Bill

Ravi Prakash Gutala

Jonathan S Su

A shift register page buffer for use in an array of multiple bits-per-cell flash EEPROM memory cells so as to render page mode programming and reading is provided. A sensing logic circuit (26,27) is used to selectively and sequentially compare array bit line voltages with each of a plurality of target reference cell bit line voltages. Shift register circuit (300) is responsive to the sensing logic circuit for sequentially storing either a low or high logic level after each comparison of the bit line voltages with one of the plurality of target reference voltages. Each of the shift register circuits is formed of series-connected latch circuits (302-308), each having inputs and outputs. A switching transistor (N5) is interconnected between the sensing logic circuit and the latch circuits and is responsive to a corresponding output of the latch circuits for selectively passing the logic signal from the sensing circuit means to the input of the latch circuits.

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Sant Clara, CA, United States of America

Qimeng Derek Zhou