The General Hospital Corporation

Nanyang Technological University

Qiaozhou Xiong

Brett Eugene Bouma

Linbo Liu

Xinyu Liu

Martin Villiger

Nanshuo Wang

A method for determining a retardance of a layer of a sample. The method includes: transmitting a first portion of a polarized light to a sample arm of an optical system and a second portion of the polarized light to a reference arm of the optical system; combining first return light returned from the sample arm and second return light from the reference arm; detecting, using a detector, the combined light along a first polarization state and a second polarization state to produce polarization data, the second polarization state being different from the first polarization state; determining, using a processor coupled to the detector, polarization states of light returning from upper and lower surfaces of a layer of the sample based on detecting the combined light; and determining, using the processor, a retardance of the layer of the sample based on the determined polarization states.

Growing community of inventors

Singapore, Singapore

Qiaozhou Xiong