Cstone Pharmaceuticals

Cstone Pharmaceuticals (shanghai) Co., Ltd.

Cstone Pharmaceuticals (suzhou) Co., Ltd.

Siemens Healthcare Gmbh

Semiconductor Manufacturing International (shanghai) Corporation

Semiconductor Manufacturing International (beijing) Corporation

Saint-gobain Performance Plastics Corporation

Grace Semiconductor Manufacturing Corporation

Wuxi Fortune Pharmaceutical Co., Ltd

Sas E&p Ltd.

Cstone Pharmaceutical (suzhou) Co., Ltd.

Cstone Pharmaceuticals Co., Ltd.

Qiang Guo

Hao Wu

Changqing Wei

Yonggang Liao

Yao Xiao

Shuhui Chen

Yi Shan Jiang

Bin Liu

Wenyuan Qian

Guosheng Wu

Lianxiang Wang

Weiwei Mao

Lili Fan

Xuejian Zheng

Xiaoye Liu

Zhentang Fu

Bin Gong

Qiang Ma

Jiaen Song

Biao Guo

Ming Zhou

Guoliang Pan

Ao Lin Tang

Guifen Zhang

Hailong Wang

Xiangqing Xu

Song Zhao

Yuanyuan Hou

Peng Jing

Yingying Dong

Quxiang Li

Minquan Yu

Yinli Qiu

Shuang Zhang

Aijun Lu

Disclosed in the present invention are a polymorph A of a compound represented by formula (I), and an application thereof in preparation of drugs for treating HDAC6-associated diseases. 

Polymorph of HDAC6-selective inhibitor and application thereof

The present invention discloses crystal forms and salt forms of a 7H-pyrrolo[2,3-d]pyrimidine compounds and preparation methods thereof, and further discloses use of the crystal forms and the salt forms in the manufacture of a medicament for treating arthritis.

Crystal forms and salt forms of 7h-pyrrolo[2,3-d]pyrimidine compounds and preparation method thereof

Compounds serving as histone deacetylase 6 (HDAC6) selective inhibitors, and applications thereof in the preparation of drugs for treating HDAC6-related diseases. Specifically disclosed are a compound as represented by formula (I) and a pharmaceutically acceptable salt thereof. 

HDAC6 selective inhibitors, preparation method therefor, and application thereof

A mobile X-ray examination apparatus has an instruction receiving device that receives an entered instruction for the mobile X-ray examination apparatus to reach a designated position. A navigation device creates an environment map of an environment of the mobile X-ray examination apparatus, determines a current position of the mobile X-ray examination apparatus according to detected environment profile information, calculates a movement trajectory of the mobile X-ray examination apparatus according to the environment map, the current position and the designated position received by the instruction receiving device, and sends corresponding information to a central control device. The central control device causes the mobile X-ray examination apparatus to reach the designated position along the movement trajectory according to the corresponding information sent by the navigation device.

Mobile X-ray examination apparatus

A bearing article can include a metal substrate having a bronze layer; a PEEK layer; a PTFE composition layer overlying and penetrating the PEEK layer. A method for preparing a bearing article can include providing a metal substrate with a sintered bronze layer, electrostatic spraying a non-fluorinated polymer onto the metal substrate followed by spraying a fluorinated polymer onto the non-fluorinated polymer and heat rolling to form a laminate.

Method of forming a laminate

An apparatus and a method for detecting vibration are disclosed. The apparatus comprises a housing, a magnetic structure forming a magnetic field in the housing, and a coil structure in the magnetic field, concentric of the magnetic structure. In response to external vibration, the coil structure and the magnetic structure are movable with respect to each other. The coil structure comprises at least two sets of coils overlapped in space, of which a first coil set is for detecting vibration and a second coil set is for applying control in accordance with a control signal.

Dual-coil geophone accelerometer

The present invention discloses a pad structure and a method for testing a integrated circuit. The structure includes the first pads and the second pads, where the first pads are distributed over a peripheral portion of the integrated circuit and connected with lead-out wires of the integrated circuit, and the second pads are connected with a metal line at a circuit portion in the integrated circuit and are sized larger than the minimum characteristic dimension of the metal line and of the integrated circuit and smaller than the size of the first pads. The pad structure and method can position a test portion with improved efficiency. Correspondingly, a probe can be used to position the test portion with improved accuracy as well.

Pad structure and test method

A processing method for the metal surface in a dual damascene manufacturing is applied to a dual damascene semiconductor structure. The dual damascene semiconductor structure has a metal structure and a spin-on-dielectric (SOD) layer formed on the metal structure, wherein the SOD layer has at least one opening exposing a partial surface of the metal structure. Before the opening is filled, the monoxide on the exposed surface is first removed, then the exposed surface is treated by the plasma at an angle inclined to an axis perpendicular to the exposed surface. The processing method provided in the present invention can avoid the exposed surface being damaged by the plasma and improve the adhesion force between the exposed metal surface and the stuff.

Method of processing metal surface in dual damascene manufacturing

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Shanghai, China

Qiang Guo