Mstar Semiconductor, Inc.

Qi-Xin Chang

Chung-Ching Chen

Chen-Nan Lin

Yung Peng Chang

Jian-Kao Chen

A memory test data generating circuit and method for generating a plurality of sets of test data is provided. The plurality of sets of test data is provided to a memory via a plurality of channels by a memory controller and is for testing the memory. The memory test data generating circuit includes: a plurality of counters, generating a plurality of counter values; and a data repetition and combination unit, generating the plurality of sets of test data according to the plurality of counter values, a bit width between the memory test data generating circuit and the memory controller, and a bit width between the memory controller and the memory. The test data of each channel is an identical and periodical data series.

Memory test data generating circuit and method

A timing controller for a panel display system includes: an image signal receiver that receives an image signal; an overdrive circuit that receives and converts the image signal from the image signal receiver according to successive first frame data and second frame data in the image signal; an image signal transmitter that receives the converted image signal from the overdrive circuit and transmits the same to a display panel; a memory; and a memory interface unit. In a normal read/write period, the memory interface unit receives the first frame data from the overdrive circuit and stores the same in the memory, and fetches the first frame data from the memory when the overdrive circuit receives the second frame data in the image signal and transmits the same to the overdrive circuit. The memory interface unit further obtains sampling results to generate a preferred delay phase.

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Zhubei, Taiwan

Qi-Xin Chang